BS IEC 62951-9:2022

$79.05

Semiconductor devices. Flexible and stretchable semiconductor devices – Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells

Published By	Publication Date	Number of Pages
BSI	2022	22

Guaranteed Safe Checkout

Categories: 31.080.01 - Semiconductor devices in general, BSI

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

Description

PDF Catalog

PDF Pages	PDF Title
2	undefined
4	CONTENTS
5	FOREWORD
7	1 Scope 2 Normative references 3 Terms and definitions
9	4 Device under testing (DUT)
10	5 Test method 5.1 General 5.2 Test equipment and tools 5.2.1 General Figures Figure 1 – 1T1R resistive memory cell
11	5.2.2 Read Figure 2 – Block diagram of the measurement setup of 1T1R resistive memory cells Figure 3 – Read operation of 1T1R resistive memory cell
12	5.2.3 Forming Figure 4 – Cumulative probability distribution of HRSand LRS of 1T1R resistive memory cells
13	5.2.4 SET programming Figure 5 – Forming operation of 1T1R resistive memory cell Figure 6 – Simulation test flow chart of the forming process
14	5.2.5 RESET programming Figure 7 – SET operation of 1T1R resistive memory cell Figure 8 – Simulation test flow chart of the SET operation of 1T1R resistive memory cell
15	Figure 9 – RESET operation of 1T1R resistive memory cell Figure 10 – Simulation test flow chart of the RESET operationof 1T1R resistive memory cell
16	5.2.6 Endurance Figure 11 – Cumulative resistance distribution of 1T1R resistive memory
17	Figure 12 – Simulation test flow chart of the endurance testof 1T1R resistive memory cell Figure 13 – Exemplary endurance data of a 1T1R resistive memory cell
18	5.2.7 Retention Figure 14 – Simulation test flow chart of retention propertyof 1T1R resistive memory cells Figure 15 – Exemplary retention characteristics of 1T1R resistive memory cells
19	5.3 Test report
20	Bibliography

Additional information

Status	Definitive
Pages	22
Publication Date	2022-12-20
ISBN	978 0 539 14437 6
Standard Number	BS IEC 62951-9:2022
Title	Semiconductor devices. Flexible and stretchable semiconductor devices – Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
Identical National Standard Of	IEC 62951-9 Ed.1.0
Descriptors	Semiconductor devices, Performance testing, Testing methods, Transistors, Resistors, Flexible conductors
Publisher	BSI
Committee	EPL/47
ICS Codes	31.080.01 - Semiconductor devices in general

Preview PDF


PDF Format	Searchable	Printable	Preview Now

BS IEC 62951-9:2022

PDF Catalog

Related products