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BS ISO 14606:2000:2001 Edition

BS ISO 14606:2000:2001 Edition

$142.49

Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials

Published By Publication Date Number of Pages
BSI 2001 24
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Status

Withdrawn
Title

Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Publisher

BSI
Committee

CII/60
Pages

24
Publication Date

2001-01-15
Withdrawn Date

2015-12-31
Replaced By

BS ISO 14606:2015
ISBN

0 580 36853 X
Standard Number

BS ISO 14606:2000
Identical National Standard Of

ISO 14606:2000
Descriptors

Augers, Depth, Electron emission, Microscopic analysis, Control samples, Surface chemistry, Chemical analysis and testing, Laminates, Profile measurement, Mass spectrometry, Spectroscopy, Reference conditions, X-rays, Surface properties, Spectrochemical analysis, Radiation measurement
ICS Codes 71.040.40 - Chemical analysis
BS ISO 14606:2000
$142.49