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BS ISO 15932:2013

BS ISO 15932:2013

$142.49

Microbeam analysis. Analytical electron microscopy. Vocabulary

Published By Publication Date Number of Pages
BSI 2013 32
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This International Standard defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order.

This International Standard is applicable to all standardization documents relevant to the practice of AEM. In addition, some parts of this International Standard are applicable to those documents relevant to the practice of related fields (e.g. TEM, STEM, SEM, EPMA, EDX) for the definition of those terms common to them.

NOTE See also the ISO online browsing platform (OBP): /2

PDF Catalog

PDF Pages PDF Title
6 Foreword
7 Introduction
9 Section sec_0
Section sec_1
0 Scope
1 Abbreviated terms
10 Section sec_2
Section sec_2.1
Section sec_2.1.1
Section sec_2.1.1.1
Section sec_2.1.1.2
Section sec_2.1.2
Section sec_2.1.2.1
Section sec_2.1.2.2
Section sec_2.1.2.2.1
Section sec_2.1.2.2.2
2 Definitions of terms used in the physical basis of AEM
11 Section sec_2.1.3
Section sec_2.1.3.1
Section sec_2.1.3.2
Section sec_2.1.4
Section sec_2.1.5
Section sec_2.2
Section sec_2.2.1
Section sec_2.2.1.1
Section sec_2.2.2
Section sec_2.2.2.1
12 Section sec_2.2.2.2
Section sec_2.2.2.3
Section sec_2.2.2.4
Section sec_2.2.3
Section sec_2.3
Section sec_2.3.1
Section sec_2.3.2
Section sec_2.4
Section sec_2.5
Section sec_2.5.1
Section sec_2.5.2
13 Section sec_2.5.3
Section sec_2.5.4
Section sec_2.5.5
Section sec_2.6
Section sec_2.6.1
Section sec_2.7
Section sec_2.8
Section sec_2.9
Section sec_3
Section sec_3.1
Section sec_3.1.1
Section sec_3.1.2
3 Definitions of terms used in AEM instrumentation
14 Section sec_3.1.2.1
Section sec_3.1.2.2
Section sec_3.1.2.3
Section sec_3.1.3
Section sec_3.1.3.1
Section sec_3.1.3.2
Section sec_3.1.3.3
Section sec_3.1.3.4
Section sec_3.1.3.5
Section sec_3.1.3.6
Section sec_3.1.4
15 Section sec_3.1.5
Section sec_3.1.6
Section sec_3.1.7
Section sec_3.2
Section sec_3.2.1
Section sec_3.2.2
Section sec_3.2.2.1
Section sec_3.2.2.2
Section sec_3.2.2.3
16 Section sec_3.2.3
Section sec_3.2.3.1
Section sec_3.2.3.2
Section sec_3.2.3.3
Section sec_3.2.3.4
Section sec_3.2.3.5
Section sec_3.2.4
Section sec_3.2.5
Section sec_3.2.5.1
Section sec_3.2.6
Section sec_3.2.7
Section sec_3.2.8
Section sec_3.2.8.1
17 Section sec_3.2.9
Section sec_3.2.9.1
Section sec_3.2.10
Section sec_3.3
Section sec_3.4
Section sec_3.4.1
Section sec_3.4.2
Section sec_3.4.3
Section sec_3.4.4
Section sec_3.4.5
Section sec_3.4.6
Section sec_3.4.7
Section sec_3.4.8
18 Section sec_3.5
Section sec_3.6
Section sec_3.7
Section sec_3.7.1
Section sec_4
Section sec_4.1
Section sec_4.2
Section sec_4.3
Section sec_4.4
Section sec_4.5
Section sec_4.5.1
Section sec_4.6
4 Definitions of terms used in specimen preparation of AEM
19 Section sec_4.7
Section sec_4.8
Section sec_4.9
Section sec_4.10
Section sec_4.11
Section sec_4.12
Section sec_5
Section sec_5.1
Section sec_5.2
Section sec_5.3
5 Definitions of terms used in AEM image formation and processing
20 Section sec_5.4
Section sec_5.4.1
Section sec_5.4.1.1
Section sec_5.4.1.2
Section sec_5.5
Section sec_5.6
Section sec_5.7
Section sec_5.8
Section sec_5.9
Section sec_5.9.1
Section sec_5.9.2
21 Section sec_5.9.3
Section sec_5.9.4
Section sec_5.9.5
Section sec_5.9.6
Section sec_6
Section sec_6.1
Section sec_6.1.1
Section sec_6.1.2
Section sec_6.1.3
Section sec_6.1.4
Section sec_6.2
6 Definitions of terms used in AEM image interpretation and analysis
22 Section sec_6.2.1
Section sec_6.3
Section sec_6.4
Section sec_6.4.1
Section sec_6.4.2
Section sec_6.4.3
Section sec_6.5
Section sec_6.5.1
Section sec_6.5.1.1
Section sec_6.5.1.2
Section sec_6.5.2
Section sec_6.5.3
Section sec_6.5.4
23 Section sec_6.6
Section sec_6.6.1
Section sec_6.6.2
Section sec_6.6.3
Section sec_6.6.4
Section sec_6.6.5
Section sec_6.6.6
Section sec_6.6.7
Section sec_6.6.8
Section sec_6.6.9
Section sec_6.6.9.1
24 Section sec_6.6.10
Section sec_6.7
Section sec_6.8
Section sec_6.9
Section sec_6.10
Section sec_6.11
Section sec_6.12
Section sec_6.12.1
Section sec_6.12.2
Section sec_6.12.3
Section sec_6.13
25 Section sec_7
Section sec_7.1
Section sec_7.2
Section sec_7.2.1
Section sec_7.2.2
Section sec_7.3
Section sec_7.4
Section sec_7.5
Section sec_7.6
Section sec_7.7
7 Definitions of terms used in the measurement and calibration of AEM image magnification and resolution
26 Section sec_7.8
Section sec_7.8.1
Section sec_7.9
Section sec_7.10
Section sec_8
Section sec_8.1
Section sec_8.2
Section sec_8.3
Section sec_8.3.1
8 Definitions of terms used in electron diffraction in AEM
27 Section sec_8.3.2
Section sec_8.3.3
Section sec_8.3.3.1
Section sec_8.3.3.2
Section sec_8.3.4
Section sec_8.3.5
Section sec_8.3.6
Section sec_8.4
Section sec_8.5
Section sec_8.5.1
Section sec_8.5.2
Section sec_8.5.3
Section sec_8.5.3.1
28 Section sec_8.5.4
Section sec_8.5.5
29 Reference ref_1
Reference ref_2
Reference ref_3
Reference ref_4
Reference ref_5
Reference ref_6
Reference ref_7
Reference ref_8
Reference ref_9
Reference ref_10
Bibliography
BS ISO 15932:2013
$142.49