BS ISO 18118:2004:2005 Edition
$142.49
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
Published By | Publication Date | Number of Pages |
BSI | 2005 | 32 |
Status | Withdrawn |
---|---|
Title | Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials |
Publisher | BSI |
Committee | CII/60 |
Pages | 32 |
Publication Date | 2005-03-31 |
Withdrawn Date | 2015-04-30 |
Replaced By | BS ISO 18118:2015 |
ISBN | 0 580 45710 9 |
Standard Number | BS ISO 18118:2004 |
Identical National Standard Of | ISO 18118:2004 |
Descriptors | Surface chemistry, Quantitative analysis, Spectroscopy, Experimental data, Sensitivity, Auger electron spectroscopy, Chemical analysis and testing, Electron emission, Photoelectron spectroscopy, Chemical composition, X-ray photoelectron spectroscopy, Homogeneity |
ICS Codes | 71.040.40 - Chemical analysis |