BS ISO 18118:2015
$167.15
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
| Published By | Publication Date | Number of Pages |
| BSI | 2015 | 38 |
This International Standard gives guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 6 | Foreword |
| 7 | Introduction |
| 9 | 1 Scope 2 Normative references 3 Terms and definitions |
| 10 | 4 Symbols and abbreviated terms |
| 11 | 5 General information |
| 12 | 6 Measurement conditions 6.1 General 6.2 Excitation source 6.3 Energy resolution 6.4 Energy step and scan rate 6.5 Signal intensity 6.6 Gain and time constant (for AES instruments with analogue detection systems) 6.7 Modulation to generate a derivative spectrum |
| 13 | 7 Data-analysis procedures 8 Intensity-energy response function 9 Determination of chemical composition using relative sensitivity factors 9.1 Calculation of chemical composition 9.1.1 General |
| 14 | 9.1.2 Composition determined from elemental relative sensitivity factors 9.1.3 Composition determined from atomic relative sensitivity factors or average matrix relative sensitivity factors 9.2 Uncertainties in calculated compositions |
| 15 | Annex A (normative) Formulae for relative sensitivity factors |
| 28 | Annex B (informative) Information on uncertainty of the analytical results |
| 31 | Bibliography |
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