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BS ISO 20341:2003

$86.31

Surface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials

Published By Publication Date Number of Pages
BSI 2003 14
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This part of ISO 3262 specifies the requirements and the corresponding methods of test for natural quartz (ground).

PDF Catalog

PDF Pages PDF Title
3 TitlePage – Surface chemical analysis�— Secondary- ion mass spectrometry�— Method for estimating …
5 TableofContent – Contents Page
6 Foreword – Foreword
7 Introduction – Introduction
9 Scope – 1��� Scope
UntitledSubclause2 – 1.1��� This International Standard
UntitledSubclause2 – 1.2��� This International Standard
NormativeReference – 2��� Normative references
Clause1 – 3��� Symbols
Clause1 – 4��� Requirements for multiple delta-layer reference materials
UntitledSubclause2 – 4.1��� Ideal delta-layers have single atomic layer thickness according to th…
UntitledSubclause2 – 4.2��� The matrix of sputtered surface layers shall not change during SIMS d…
10 UntitledSubclause2 – 4.3��� The surface and the delta-layers shall be flat and parallel to each o…
UntitledSubclause2 – 4.4��� The thickness of the doped delta-layers shall be sufficiently less th…
UntitledSubclause2 – 4.5��� The spacing between adjacent delta-layers shall be large enough so th…
UntitledSubclause2 – 4.6��� The thickness, the position and the interface roughness of the delta-…
Clause1 – 5��� Procedures
UntitledSubclause2 – 5.1��� For adjustment and optimization of the secondary-ion mass spectromete…
UntitledSubclause2 – 5.2��� For the use of
UntitledSubclause2 – 5.3��� Before estimating the SIMS depth resolution parameters, if the backgr…
11 UntitledSubclause2 – 5.4��� To estimate the decay lengths and the Gaussian broadening, non-linear…
Clause1 – 6��� Test report
12 AnnexNormative – Simpler options of estimating SIMS depth resolution parameters
Clause1 – A.1��� General
Clause1 – A.2��� Procedure
13 Bibliography – Bibliography
BS ISO 20341:2003
$86.31