BS ISO 22489:2016
$142.49
Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
| Published By | Publication Date | Number of Pages |
| BSI | 2016 | 26 |
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 6 | Foreword |
| 7 | Introduction |
| 9 | 1 Scope 2 Normative references 3 Abbreviated terms |
| 10 | 4 Procedure for quantification 4.1 General procedure for quantitative microanalysis 4.1.1 Principle and procedure of quantitative microanalysis 4.1.2 Coverage of the quantitative analysis |
| 11 | 4.1.3 Selection of reference materials 4.2 Specimen preparation 4.3 Calibration of the instrument 4.3.1 Accelerating voltage 4.3.2 Probe current 4.3.3 X-ray spectrometer |
| 12 | 4.3.4 Dead time 4.4 Analysis conditions 4.4.1 Accelerating voltage 4.4.2 Probe current 4.4.3 Analysis position |
| 13 | 4.4.4 Probe diameter 4.4.5 Scanning the focused electron beam 4.4.6 Specimen surface 4.4.7 Selection of X-ray line 4.4.8 Spectrometer |
| 14 | 4.4.9 Method for measurement of X-ray peak intensity 4.4.10 Method for measurement of background intensity 4.5 Correction method based on analytical models 4.5.1 Principles |
| 15 | 4.5.2 Correction models 4.6 Calibration curve method 4.6.1 Principle |
| 16 | 4.6.2 Selection of reference materials 4.6.3 Procedure 4.7 Uncertainty 5 Test report |
| 18 | Annex A (informative) Physical effects and correction |
| 20 | Annex B (informative) Outline of various correction techniques |
| 22 | Annex C (informative) Measurement of the k-ratios in case of “chemical effects” |
| 23 | Bibliography |
