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BS ISO 22493:2008

BS ISO 22493:2008

$167.15

Microbeam analysis. Scanning electron microscopy. Vocabulary

Published By Publication Date Number of Pages
BSI 2008 34
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Status

Withdrawn
Title

Microbeam analysis. Scanning electron microscopy. Vocabulary
Publisher

BSI
Committee

CII/9
Pages

34
Publication Date

2008-10-31
Withdrawn Date

2014-04-30
Replaced By

BS ISO 22493:2014
ISBN

978 0 580 54987 8
Standard Number

BS ISO 22493:2008
Identical National Standard Of

ISO 22493:2008
Descriptors

Electron beams, Electron optics, Scanning electron microscopes, Instrumental methods of analysis, Optical instruments, Terminology, Vocabulary, Microscopes, Electron microscopes
ICS Codes 01.040.37 - Image technology (Vocabularies)
BS ISO 22493:2008
$167.15