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BS ISO 24173:2024 – TC

BS ISO 24173:2024 – TC

$246.62

Tracked Changes. Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction

Published By Publication Date Number of Pages
BSI 2024 126
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PDF Catalog

PDF Pages PDF Title
78 undefined
82 Foreword
83 Introduction
85 1 Scope
2 Normative references
3 Terms and definitions
90 4 Equipment for EBSD
91 5 Operating conditions
5.1 Specimen preparation
5.2 Specimen alignment
5.3 Common steps in collecting an EBSP
5.3.1 Setting the microscope operating conditions
92 5.3.2 Detector and working distances
5.3.3 Camera integration/exposure time
5.3.4 Binning
93 5.3.5 EBSP averaging
5.3.6 EBSP background correction/EBSP signal correction
94 5.3.7 Band detection
95 6 Calibrations required for indexing of EBSPs
98 7 Analytical procedure
7.1 Operating conditions
99 7.2 Equipment stability check
7.3 EBSD analysis
8 Measurement uncertainty
8.1 General
8.2 Uncertainty of crystal orientation measurement
8.3 Absolute orientation
8.4 Relative orientation
100 9 Reporting the results
101 Annex A (informative) Principle of EBSD
102 Annex B (informative) Specimen preparation for EBSD
108 Annex C (informative) Brief introduction to crystallography and EBSP indexing, and other information useful for EBSD
123 Bibliography

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BS ISO 24173:2024 - TC
$246.62