BS ISO 3951-1:2022 – TC

$280.87

Tracked Changes. Sampling procedures for inspection by variables – Specification for single sampling plans indexed by acceptance quality limit (AQL) for lot-by-lot inspection for a single quality characteristic and a single AQL

Published By	Publication Date	Number of Pages
BSI	2022	320

Guaranteed Safe Checkout

Categories: 03.120.30 - Application of statistical methods, BSI

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

Description

PDF Catalog

PDF Pages	PDF Title
1	compares BS ISO 3951-1:2022
2	TRACKED CHANGES Text example 1 — indicates added text (in green)
3	National foreword Contractual and legal considerations Compliance with a British Standard cannot confer immunity from legal obligations. Amendments/corrigenda issued since publication
5	COPYRIGHT PROTECTED DOCUMENT
8	Foreword
10	Introduction CAUTION — The procedures in this part of ISO 3951document are not suitable for application to lots that have been screened for nonconforming items.
11	Table 1 — Summary table
13	INTERNATIONAL STANDARD ISO 3951-1:2013ISO 3951-1:2022(E) 1 Scope 2 Normative references
14	3 Terms and definitions 3.1 3.2 3.3 3.4 3.5
15	3.6 3.7 3.8 3.9 3.10 3.11
16	3.12 3.123.13 3.133.14 3.143.15 L 3.153.16 U 3.163.17 3.173.18 k
17	3.19 3.183.20 Q 3.193.21 3.203.22 3.21
18	3.223.23 3.233.24 3.243.25
19	4 Symbols
21	5 Acceptance quality limit (AQL) 5.1 Concept
22	5.2 Use 5.3 Specifying AQLs 5.4 Preferred AQLs 5.5 Caution 5.6 Limitation 5 Choice of a sampling plan 5.1 Choice between variables and attributes
23	5.2 General 5.3 Choice between the s-method and σ-method
24	5.4 Choice of inspection level and AQL
25	6 Standard procedures for the s-method 6.1 General 6.2 Single specification limits
26	6.3 Double specification limits 7 Standard procedures for the σ-method 7.1 General 7.2 Single specification limits
27	7.3 Double specification limits 8 The p*-method
28	6 Switching rules for normal, tightened, and reduced inspection 9 Switching between inspection severities
29	9.1 Rules for switching between inspection severities
30	9.2 Records for switching between inspection severities
31	710 Relation to ISO 2859-1 7.110.1 Similarities 7.210.2 Differences
32	8 Consumer protection 8.1 Use of individual plans 8.2 Consumer’s risk quality (CRQ) tables 8.3 Producer’s risk tables
33	8.4 Operating characteristic (OC) curves 911 Allowing for measurement uncertainty 10 Planning 11 Choice between variables and attributes
34	12 Choice between the s-method and σ-method
35	12 Normality, data transformations and outliers 12.1 Normality 12.2 Data transformations 12.3 Outliers 13 Choice of inspection level and AQL
36	13 Monitoring and recording of inspection results 13.1 Monitoring of inspection results 13.2 Process capability and performance assessment 13.3 Monitoring of process parameters 14 Choice of sampling scheme 14.1 Standard plans
37	14.2 Special plans 14 Tables 14.1 Form k for single sampling plans: s-method
38	Table 2 — Single sampling plans of form k for normal inspection: s–method
40	Table 3 — Single sampling plans of form k for tightened inspection: s–method
42	Table 4 — Single sampling plans of form k for reduced inspection: s–method
44	14.2 Form k for single sampling plans: σ-method
45	Table 5 — Single sampling plans of form k for normal inspection: σ–method
47	Table 6 — Single sampling plans of form k for tightened inspection: σ–method
48	Table 6 (continued)
49	Table 7 — Single sampling plans of form k for reduced inspection: σ–method
50	Table 7 (continued)
51	14.3 Form p* single sampling plans
52	Table 8 — Single sampling plans of form p* for normal inspection (ns sample size for s-method, nσ sample size for σ–method)
54	Table 9 — Single sampling plans of form p* for tightened inspection (ns sample size for s-method, nσ sample size for σ–method)
56	Table 10 — Single sampling plans of form p* for reduced inspection (ns sample size for s-method, nσ sample size for σ–method)
58	14.4 Values of fσ for maximum process standard deviation (MPSD) Table 11 — Values of fσ for maximum process standard deviation for combined control of double specification limits: σ–method 14.5 Supplementary acceptance constants for qualifying towards reduced inspection Table 12 — Supplementary acceptance constants for qualifying towards reduced inspection
59	15 Preliminary operations 15 Examples 15.1 General
60	15.2 Examples for the s-method
61	Figure 2 — Example of the use of an acceptance diagram, s–method
62	Figure 3 — Example of the use of an acceptance diagram, s–method
64	Figure 4 — Example of the use of an acceptance diagram, s–method
65	Figure 5 — Example of the use of a standardized acceptance diagram, s–method
66	Figure 6 — Example of the use of an acceptance diagram, s–method
67	15.3 Examples for the σ-method
68	Figure 8 — Example of the use of an acceptance diagram, σ–method
69	Figure 9 — Example of the use of an acceptance diagram, σ–method
71	15.4 Examples for the p*-method
74	16 Standard procedures for the s-method 16.1 Obtaining a plan, sampling, and preliminary calculations 16.2 Acceptability criteria for single specification limits
76	16.3 Graphical method for a single specification limit Figure 1 — Example of the use of an acceptance chart for a single specification limit, s—method 16.4 Acceptability criterion for combined control of double specification limits 16.4.1 General
77	16.4.2 Procedure for sample size 3
78	16.4.3 Procedure for sample size 4 For sample size 4 under the s–method, proceed as follows. After calculating the sample mean, , and the sample standard deviation, s, find the applicable value of the coefficient f s from Table D.1, D.2, or D.3. Determine the MSSD (i.e. the maximum all…
79	16.4.4 Procedure for sample sizes greater than 4
81	Figure 2 — Example of the use of an acceptance chart for combined control of double specification limits: s-method with actual scales 17 Standard procedures for the σ-method 17.1 Obtaining a plan, sampling, and preliminary calculations
82	Figure 3 — Example of the use of an acceptance chart for combined control of double specification limits: s-method with normalized scales 17.2 Acceptability criteria for a single specification limit
83	17.3 Acceptability criterion for combined control of double specification limits
84	18 Procedure during continuing inspection 19 Normality and outliers 19.1 Normality 19.2 Outliers
85	20 Records 20.1 Control charts 20.2 Lots that are not accepted 21 Operation of switching rules
86	22 Discontinuation and resumption of inspection 23 Switching between the s-method and σ-method 23.1 Estimating the process standard deviation 23.2 State of statistical control 23.3 Switching from the s -method to the σ -method 23.4 Switching from the σ -method to the s -method
88	24 Charts B to R — Operating characteristic curves and tabulated values for single sampling plans, normal inspection: s-method 24.1 Operating characteristic curves and tabulated values for sample size code letter B: s-method
89	24.2 Operating characteristic curves and tabulated values for sample size code letter C: s-method
90	24.3 Operating characteristic curves and tabulated values for sample size code letter D: s-method
102	24.15 Operating characteristic curves and tabulated values for sample size code letter R: s-method
103	25 Charts s-D to s-R — Acceptance curves for combined control of double specification limits: s-method
105	Figure 22 — Chart s-F: Acceptance curves for combined control of double specification limits for sample size code letter F under normal and tightened inspection and for sample size code letter H under reduced inspection
109	Figure 26 — Chart s-K: Acceptance curves for combined control of double specification limits for sample size code letter K under normal and tightened inspection and for sample size code letter M under reduced inspection
110	Figure 27 — Chart s-L: Acceptance curves for combined control of double specification limits for sample size code letter L under normal and tightened inspection and for sample size code letter N under reduced inspection
111	Figure 28 — Chart s-M: Acceptance curves for combined control of double specification limits for sample size code letter M under normal and tightened inspection and for sample size code letter P under reduced inspection
112	Figure 29 — Chart s-N: Acceptance curves for combined control of double specification limits for sample size code letter N under normal and tightened inspection and for sample size code letter Q under reduced inspection
113	Figure 30 — Chart s-P: Acceptance curves for combined control of double specification limits for sample size code letter P under normal and tightened inspection and for sample size code letter R under reduced inspection
114	Figure 31 — Chart s-Q: Acceptance curves for combined control of double specification limits for sample size code letter Q under normal and tightened inspection
116	Annex A Table for determining the sample size code letter
117	Annex A Procedures for obtaining s and σ A.1 Procedure for obtaining s A.1.1 Definition A.1.2 One-pass formula A.1.3 Potential numerical inaccuracy
118	A.1.4 An updating algorithm for sequential data A.1.5 Spreadsheets and pocket calculators
119	A.2 Procedure for obtaining σroot A.2.1 Definition A.2.2 Simplication for equal sample sizes
120	Annex B Form k for single sampling plans: s-method Table B.1 — Single sampling plans of Form k for normal inspection: s–method
121	Table B.2 — Single sampling plans of Form k for tightened inspection: s–method
122	Table B.3 — Single sampling plans of Form k for reduced inspection: s–method
123	Annex B Accommodating measurement variability B.1 General
124	B.2 Process standard deviation σ and measurement standard deviation σm are both known B.3 Process standard deviation σ is unknown but measurement standard deviation σm is known B.4 Process standard deviation σ and measurement standard deviation σm are both unknown
126	Table B.1 — Sample results for the example of B.4 Table B.2 — Sample results with subtraction of 12,9 for the example of B.4
128	Annex C Form k for single sampling plans: σ-method Table C.1 — Single sampling plans of Form k for normal inspection: σ–method
129	Table C.2 — Single sampling plans of Form k for tightened inspection: σ–method
130	Table C.3 — Single sampling plans of Form k for reduced inspection: σ–method
131	Annex C Sampling strategies Figure C.1 — Examples of different sampling strategies with a two-dimensional population
133	Annex D Values of f s for maximum sample standard deviation (MSSD) Table D.1 — Values of f s for maximum sample standard deviation for combined control of double specification limits: normal inspection, s–method
134	Table D.2 — Values of f s for maximum sample standard deviation for combined control of double specification limits: tightened inspection, s–method Table D.3 — Values of f s for maximum sample standard deviation for combined control of double specification limits: reduced inspection, s–method
136	Annex D Operating characteristics for the σ–method D.1 Probability of acceptance for the σ-method D.2 Example D.3 Comparison with tabulated value for the s–method
137	Annex E Values of fσ for maximum process standard deviation (MPSD) Table E.1 — Values of f σ for maximum process standard deviation for combined control of double specification limits: σ–method
138	Annex E Operating characteristic for the s-method – tabulated values for single sampling plans, normal inspection E.1 Probability of acceptance for the s-method
147	Annex F Estimating the process fraction nonconforming for sample size 3: s-method
150	Annex F Consumer’s risk qualities F.1 The consumer’s risk quality for the s-method plans F.2 Tables for the consumer’s risk qualities for the s–method plans F.3 The consumer’s risk quality for the σ–method plans
151	F.4 Tables for the consumer’s risk qualities for the σ–method plans
158	Annex G Single sampling plans of Form p*
159	Annex G Producer’s risks G.1 The producer’s risk for the s-method plans G.2 Tables for the producer’s risks for the s–method plans G.3 The producer’s risk for the σ–method plans G.4 Tables for the producer’s risk for the σ–method plans
166	Annex H Values of c U for upper control limit on the sample standard deviation Table H.1 — Values of c U for upper control limit on the sample standard deviation
167	Annex H Construction of acceptance diagrams for double specification H.1 General H.2 s-method acceptance diagrams for double specification limits under separate control Figure H.1 — acceptance region, s-method, separate control
168	H.3 s-method acceptance diagrams for double specification limits under combined control
169	Figure H.2 — acceptance region, s-method, combined control – construction lines and
170	Figure H.3 — acceptance region, s-method, combined control with construction lines and
171	H.4 σ-method – determination of combined specification limits acceptance criteria
174	Figure H.8 — acceptance region, σ-method, combined control with sample mean and standard deviation
175	H.5 standardized acceptance diagrams for double specification limits under separate control Figure H.10 — standardized acceptance region, s-method, combined control with sample mean and standard deviation
176	H.6 Spreadsheet implementation
177	Annex I Supplementary acceptability constants for qualifying towards reduced inspection Table I.1 — Supplementary acceptability constants for qualifying towards reduced inspection
178	Annex I Use of the underlying software I.1 Execution of the standard Table I.1 — Function ISO3951_1
179	I.2 Operating characteristic functions Table I.2 — Function OC
180	I.3 Confidence intervals Table I.3 — Function confint
181	I.4 Consumer’s risk quality and the producer’s risk I.5 Constructing the acceptance curve for the case with two specification limits and the s-method
183	Annex J Procedures for obtaining s and σ J.1 Procedure for obtaining s
184	J.2 Procedure for obtaining σ
185	Annex K Consumer’s risk qualities Table K.1 — Consumer’s risk quality (in percent) for normal inspection: s–method
186	Table K.2 — Consumer’s risk quality (in percent) for normal inspection: σ–method Table K.3 — Consumer’s risk quality (in percent) for tightened inspection: s–method
187	Table K.4 — Consumer’s risk quality (in percent) for tightened inspection: σ–method Table K.5 — Consumer’s risk quality (in percent) for reduced inspection: s–method
188	Table K.6 — Consumer’s risk quality (in percent) for reduced inspection: σ–method
189	Annex L Producer’s risks Table L.1 — Producer’s risk (in percent) for normal inspection: s–method
190	Table L.2 — Producer’s risk (in percent) for normal inspection: σ–method Table L.3 — Producer’s risk (in percent) for tightened inspection: s–method
191	Table L.4 — Producer’s risk (in percent) for tightened inspection: σ–method Table L.5 — Producer’s risk (in percent) for reduced inspection: s–method
192	Table L.6 — Producer’s risk (in percent) for reduced inspection: σ–method
193	Annex M Operating characteristics for the σ-method M.1 Formula for probability of acceptance M.2 Example M.3 Comparison with tabulated value for the s–method
194	Annex N Estimating the process fraction nonconforming for sample sizes 3 and 4: s-method N.1 General formula for sample size, n N.2 Formula for sample size 3
195	N.3 Formula for sample size 4
196	Annex O Accommodating measurement variability O.1 General
197	O.2 Process standard deviation σ and measurement standard deviation σm both known O.3 Process standard deviation σ unknown but measurement standard deviation σ m known O.4 Process standard deviation σ and measurement standard deviation σ m both unknown
201	Bibliography
202	Bibliography [25] R Foundation for Statistical Computing [online database]. Available from http://www.R-project.org [viewed 17 September 2020].
204	National foreword
209	Foreword
210	Introduction
213	1 Scope 2 Normative references
214	3 Terms and definitions
218	4 Symbols
219	5 Choice of a sampling plan 5.1 Choice between variables and attributes
220	5.2 General 5.3 Choice between the s-method and σ-method
221	5.4 Choice of inspection level and AQL
222	6 Standard procedures for the s-method 6.1 General 6.2 Single specification limits
223	6.3 Double specification limits 7 Standard procedures for the σ-method 7.1 General 7.2 Single specification limits
224	7.3 Double specification limits 8 The p*-method
225	9 Switching between inspection severities
226	9.1 Rules for switching between inspection severities
227	9.2 Records for switching between inspection severities 10 Relation to ISO 2859-1 10.1 Similarities
228	10.2 Differences
229	11 Allowing for measurement uncertainty 12 Normality, data transformations and outliers 12.1 Normality 12.2 Data transformations
230	12.3 Outliers 13 Monitoring and recording of inspection results 13.1 Monitoring of inspection results 13.2 Process capability and performance assessment 13.3 Monitoring of process parameters
231	14 Tables 14.1 Form k for single sampling plans: s-method
238	14.2 Form k for single sampling plans: σ-method
245	14.3 Form p* single sampling plans
252	14.4 Values of fσ for maximum process standard deviation (MPSD) 14.5 Supplementary acceptance constants for qualifying towards reduced inspection
253	15 Examples 15.1 General 15.2 Examples for the s-method
260	15.3 Examples for the σ-method
264	15.4 Examples for the p*-method
267	Annex A (informative) Procedures for obtaining s and σ
270	Annex B (informative) Accommodating measurement variability
275	Annex C (informative) Sampling strategies
277	Annex D (informative) Operating characteristics for the σ–method
278	Annex E (informative) Operating characteristic for the s-method – tabulated values for single sampling plans, normal inspection
287	Annex F (informative) Consumer’s risk qualities
294	Annex G (informative) Producer’s risks
302	Annex H (informative) Construction of acceptance diagrams for double specification limits
313	Annex I (informative) Use of the underlying software
318	Bibliography

Additional information

Status	Definitive
Pages	320
Publication Date	2022-11-16
ISBN	978 0 539 23541 8
Standard Number	BS ISO 3951-1:2022 – TC
Title	Tracked Changes. Sampling procedures for inspection by variables – Specification for single sampling plans indexed by acceptance quality limit (AQL) for lot-by-lot inspection for a single quality characteristic and a single AQL
Descriptors	Inspection, Sampling methods, Mathematical calculations, Power spectra, Statistical quality control, Quality assurance, Sampling tables, Inspection by variables, Control charts, Quality control, Standard deviation, Acceptance inspection, Normal distribution
Publisher	BSI
Committee	SS/5
ICS Codes	03.120.30 - Application of statistical methods

Preview PDF


PDF Format	Searchable	Printable	Preview Now

BS ISO 3951-1:2022 – TC

PDF Catalog

Related products