BSI 20/30405217 DC:2020 Edition
$13.70
BS EN IEC 62047-40. Semiconductor devices. Micro-electromechanical devices – Part 40. Test methods of Micro-electromechanical inertial shock switch threshold
| Published By | Publication Date | Number of Pages |
| BSI | 2020 | 11 |
| Status | Definitive |
|---|---|
| Pages | 11 |
| Publication Date | 2020-06-05 |
| Standard Number | 20/30405217 DC |
| Title | BS EN IEC 62047-40. Semiconductor devices. Micro-electromechanical devices – Part 40. Test methods of Micro-electromechanical inertial shock switch threshold |
| Identical National Standard Of | 47F/360/CD, IEC 62047-40 Ed.1.0 |
| Descriptors | Electronic equipment and components, Integrated circuits, Semiconductor devices, Semiconductor technology, Electromechanical devices, Test methods |
| Publisher | BSI |
| Committee | EPL/47 |
| ICS Codes | 31.080.99 - Other semiconductor devices |
