BSI 20/30423207 DC 2020
$13.70
BS EN IEC 62951-9. Semiconductor devices. Flexible and stretchable semiconductor devices – Part 9. Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
| Published By | Publication Date | Number of Pages |
| BSI | 2020 | 19 |
| Status | Definitive |
|---|---|
| Pages | 19 |
| Publication Date | 2020-09-11 |
| Standard Number | 20/30423207 DC |
| Title | BS EN IEC 62951-9. Semiconductor devices. Flexible and stretchable semiconductor devices – Part 9. Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells |
| Identical National Standard Of | 47/2656/CD |
| Descriptors | Semiconductor devices, Performance testing, Testing methods, Transistors, Resistors |
| Publisher | BSI |
| Committee | EPL/47 |
| ICS Codes | 31.080.01 - Semiconductor devices in general |
