BSI 24/30490678 DC 2024
$13.70
BS IEC 60747-5-18 Semiconductor devices – Part 5-18: Optoelectronic devices – Light emitting diodes – Test method light emitting diodesof the macro photoluminescence for epitaxial wafers of micro light emitting diodes
Published By | Publication Date | Number of Pages |
BSI | 2024 | 19 |
PDF Catalog
PDF Pages | PDF Title |
---|---|
5 | FOREWORD |
7 | 1 Scope 2 Normative references 3 Terms, definitions and abbreviated terms 3.1 Terms and definitions |
9 | 1 2 3 3.1 3.2 Abbreviated terms 4 Measuring methods 4.1 General 4.2 Principle |
10 | 4.3 Requirements 4 4.1 4.2 4.3 4.3.1 Measuring conditions 4.3.1 4.3.2 Measuring instruments and equipment 4.3.2 4.3.2.1 General 4.3.2.2 Laser |
11 | 4.3.2.3 Stage 4.3.2.4 Lens 4.3.2.5 Long-wavelength-pass filter 4.3.2.6 Spectrometer |
12 | 4.4 4.4 Measurement 4.4.1 Measurement setup |
13 | 4.4.2 Measurement items 4.4.3 Measurement sequence |
14 | 5 Test report |
15 | Table 1 – Summary of test report |