BSI 24/30492188 DC:2024 Edition
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Draft BS EN 63378-6 ED1. Thermal standardization on semiconductor packages – Part 6. Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points
Published By | Publication Date | Number of Pages |
BSI | 2024 | 32 |
PDF Catalog
PDF Pages | PDF Title |
---|---|
6 | FOREWORD |
8 | INTRODUCTION |
9 | 1 Scope 2 Normative references 3 Terms and definitions |
11 | 4 Definition of DXRC 4.1 General 4.2 Thermal Resistance and Capacitance (RC) topology of DXRC 4.2.1 Thermal RC topology of DXRC 4.2.2 Outline of DXRC |
12 | 4.2.3 RC values on NJA-RC 4.2.4 RC values on MPA-RC |
14 | Annex A (informative) Accuracy Verification of DXRC model for TO-252 A.1 General A.2 CFD Model |
16 | A.3 Calculation of thermal RC values |
17 | A.4 MPA-RC and DXRC model outline A.5 Optimization of RC values in MPA-RC |
18 | A.6 Result |
20 | Annex B (informative) Accuracy Verification of DXRC model for TO-263 B.1 General B.2 CFD Model |
22 | B.3 Calculation of thermal RC values |
23 | B.4 MPA-RC and DXRC model outline B.5 Optimization of RC values in MPA-RC |
24 | B.6 Result |
25 | Annex C (informative) Accuracy Verification of DXRC model for HSOP C.1 General C.2 CFD Model |
26 | C.3 Calculation of thermal RC values |
28 | C.4 MPA-RC and DXRC model outline C.5 Optimization of RC values in MPA-RC |
29 | C.6 Result |
30 | Annex D (informative) The effect of PCB layers D.1 General D.2 Verification Method D.3 Result |
32 | Bibliography |