BSI 24/30497113 DC:2024 Edition
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BS EN IEC 63567-1 Semiconductor devices. Performance evaluation of semiconductor processing components and inspection equipment – Part 1. Transmittance evaluation method of EUV pellicle
Published By | Publication Date | Number of Pages |
BSI | 2024 | 16 |
Status | Definitive |
---|---|
Pages | 16 |
Publication Date | 2024-07-12 |
Standard Number | 24/30497113 DC |
Title | BS EN IEC 63567-1 Semiconductor devices. Performance evaluation of semiconductor processing components and inspection equipment – Part 1. Transmittance evaluation method of EUV pellicle |
Publisher | BSI |
Committee | EPL/47 |