BSI PD IEC/TS 62916:2017

$102.76

Photovoltaic modules. Bypass diode electrostatic discharge susceptibility testing

Published By	Publication Date	Number of Pages
BSI	2017	16

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This document describes a discrete component bypass diode electrostatic discharge (ESD) immunity test and data analysis method. The test method described subjects a bypass diode to a progressive ESD stress test and the analysis method provides a means for analyzing and extrapolating the resulting failures using the two-parameter Weibull distribution function.

It is the object of this document to establish a common and reproducible test method for determining diode surge voltage tolerance consistent with an ESD event during the manufacturing, packaging, transportation or installation processes of PV modules.

This document does not purport to address causes of electrostatic discharge or to establish pass or fail levels for bypass diode devices. It is the responsibility of the user to assess the ESD exposure level for their particular circumstances. The data generated by this procedure may support qualification of new design types, quality control for incoming material, and/or identify the need for additional ESD controls in the manufacturing process.

Finally, this document does not apply to large energy surge events such as direct or indirect lightning exposure, utility capacitor bank switching events, or the like.

PDF Catalog

PDF Pages	PDF Title
2	undefined
4	CONTENTS
5	FOREWORD
7	1 Scope 2 Normative references 3 Terms, definitions and abbreviated terms
8	4 General 5 Sampling
9	6 Test equipment 7 Test method 7.1 Preparation Figure 1 – Example of a test setup for bypass diodes
10	7.2 Surge testing 8 Data analysis 8.1 Two-parameter Weibull distribution for analyzing voltage to failure
11	8.2 Recommended median rank estimation for the cumulative distribution 8.3 Recommended form for data analysis by least squares linear regression Table 1 – Data organization for least squares regression
12	9 Report
13	Annex A (informative) Guidelines for application
14	Annex B (informative) Example of application Figure B.1 – Chart of sample data Table B.1 – Example of data analysis