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BSI PD IEC TS 63342:2022

BSI PD IEC TS 63342:2022

$102.76

C-Si photovoltaic (PV) modules. Light and elevated temperature induced degradation (LETID) test. Detection

Published By Publication Date Number of Pages
BSI 2022 16
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PDF Catalog

PDF Pages PDF Title
2 undefined
4 CONTENTS
5 FOREWORD
7 1 Scope
2 Normative references
8 3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
3.2 Abbreviated terms
4 Samples
5 Apparatus
6 Testing
6.1 General
9 6.2 Visual inspection
6.3 Electroluminescence images
6.4 Performance at STC
Figure 1 – Test sequence for the detection of LETID in c-Si modules
10 6.5 B-O LID preconditioning via current injection (CID)
6.6 Light and elevated temperature induced degradation (LETID)
11 7 Dark voltage analysis
7.1 General
7.2 Data filtering
7.3 Temperature correction
12 7.4 Data averaging
7.5 Stop criterion
13 8 Evaluation
9 Report
Figure 2 – Dark voltage diagram showing the evolution of the temperature corrected dark voltage over time in arbitrary units during LETID degradation used to identify the time of maximum degradation and the time to stop the LETID degradation sequence
15 Bibliography

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BSI PD IEC TS 63342:2022
$102.76