🔥🔥 Don’t Miss Out on Our End of Autumn Sale. If you have any questions, feel free to click the bottom right corner to contact our customer service..

Concat us[email protected]
Shopping Cart

No products in the cart.

🔍
BSI PD ISO/TR 14999-2:2019

BSI PD ISO/TR 14999-2:2019

$215.11

Optics and photonics. Interferometric measurement of optical elements and optical systems – Measurement and evaluation techniques

Published By Publication Date Number of Pages
BSI 2019 72
PDF Format Searchable Printable Preview Now
Guaranteed Safe Checkout
Category:

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

This document gives fundamental explanations to interferometric measurement objects, describes hardware aspects of interferometers and evaluation methods, and gives recommendations for test reports and calibration certificates.

PDF Catalog

PDF Pages PDF Title
2 undefined
7 Foreword
8 Introduction
9 1 Scope
2 Normative references
3 Terms and definitions
4 Measurement objects
4.1 Surfaces
4.1.1 Boundary surfaces of optical components
10 4.1.2 Reflection degree
4.1.3 Roughness
4.1.4 Topology of the regions (discontinuous regions)
4.1.5 Continuity of the surface; gradient of the surface
11 4.1.6 Stiffness of mirrors; finite-element-calculations
4.1.7 Temperature homogeneity of mirrors
4.1.8 Examples of measurement objects
4.2 Optical components in transmission
4.2.1 Single-pass versus double-pass testing
4.2.2 Windows (wavefront aberrations in transmission)
4.2.3 Prisms (wavefront aberrations and angle error)
4.2.4 Influence of temperature on the refractive index
12 4.3 Optical systems
4.3.1 Single-pass versus double-pass testing
4.3.2 Examination in the pupil
4.3.3 Chromatic aberrations
4.4 Indirect examination of the function of optical elements
4.4.1 Examination with different wavelengths
4.4.2 Examination with different beam paths
4.4.3 Tolerance range
5 Hardware aspects of an interferometer and test environment
5.1 General
14 5.2 Construction principles and influences on the quality of measurements
5.2.1 General
15 5.2.2 Intrinsic instrument errors and the principle of common path
16 5.2.3 Optical compensation of errors
17 5.2.4 Mathematical compensation of errors
18 5.2.5 Contrast as a function of the irradiance in test and reference arm: methods to attain equilibrium in both arms
22 5.2.6 Contrast as a function of performance of the light source
24 5.3 Test environment
5.3.1 General
25 5.3.2 Influence of vibrations
26 5.3.3 Influence of gravity and support of the test piece
28 6 Methods for evaluating the optical path difference
6.1 General
6.2 Visual inspection of interferograms
6.2.1 General
6.2.2 Example 1 — Fizeau interferometer
32 6.2.3 Example 2 — Twyman-Green interferometer
34 6.3 Manual evaluation of interferograms
36 6.4 Phase measurements with temporal carrier
6.4.1 General
37 6.4.2 Heterodyne interferometry
38 6.4.3 Phase lock interferometry (PLI)
6.4.4 Synchronous detection and phase-shifting interferometry
42 6.5 Phase measurements with spatial carrier
6.5.1 Fringe analysis by Fourier transform operations
43 6.5.2 Spatially synchronous fringe analysis
45 6.6 Removal of phase ambiguities (phase unwrapping)
46 6.7 Registration of wavefronts; coordinate systems, coordinate system definition
47 6.8 Polynomial and other representations of wavefronts
6.8.1 Representation of phase data
48 6.8.2 Zernike polynomials for a circular boundary
6.8.3 Use of Zernike polynomials for an elliptical boundary
49 6.8.4 Zernike-Tatian polynomials for a circular shape with a central hole (annular)
6.8.5 Legendre polynomials for a rectangle boundary
6.8.6 Orthogonal functions on “unusual areas”
7 Test reports and calibration certificates
7.1 General
50 7.2 Content of test reports and calibration certificates
7.3 Test reports
51 7.4 Calibration certificates
7.4.1 Basics
7.4.2 Specification
7.4.3 Adjustment or repair
7.5 Opinions and interpretations
7.6 Electronic transmission of results
52 7.7 Format of reports and certificates
7.8 Amendments to test reports and calibration certificates
8 Data format
53 Annex A (informative) Orthogonal polynomials
70 Bibliography

Related products

BSI PD ISO/TR 14999-2:2019
$215.11