BSI PD ISO/TR 21477:2017
$86.31
Optics and photonics. Preparation of drawings for optical elements and systems. Surface imperfection specification and measurement systems
| Published By | Publication Date | Number of Pages |
| BSI | 2017 | 14 |
This document intends to guide the user to understand the origins, meanings and differences between the two systems of specifying and evaluating surface imperfections in ISO 10110‑7 and ISO 14997 , specifically the dimensional method and the visibility method, and to provide information on how to use them. Tables are provided to show specifications of roughly equivalent yield loss for imperfections in the two systems.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | undefined |
| 6 | Foreword |
| 7 | Introduction |
| 8 | 1 Scope 2 Normative references 3 Terms and definitions 4 General discussion of surface imperfection specification and measurement systems |
| 9 | 5 Dimensional system of surface imperfection specifications 5.1 General 5.2 Origin of the dimensional system 5.3 Dimensional comparison standard 6 Visibility system of surface imperfection specifications 6.1 General |
| 10 | 6.2 Origin of the visibility system 6.3 Brightness comparison standard 7 Comparison of visibility and dimensional specifications |
| 12 | Bibliography |
