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IEC 62416:2010

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Semiconductor devices – Hot carrier test on MOS transistors

Published By Publication Date Number of Pages
IEC 2010-04-26 24
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IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.

IEC 62416:2010
$13.65