IEC 62416:2010
$13.65
Semiconductor devices – Hot carrier test on MOS transistors
Published By | Publication Date | Number of Pages |
IEC | 2010-04-26 | 24 |
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IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
Published Code | IEC |
---|---|
Published By | International Electrotechnical Commission |
Publication Date | 2010-04-26 |
Pages Count | 24 |
Language | France |
Edition | 1.0 |
File Size | 880.6 KB |
ICS Codes | 31.080.30 - Transistors |
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