IEC 62417:2010
$7.15
Dispositifs à semiconducteurs – Essais d’ions mobiles pour transistors à semiconducteur à oxyde métallique à effet de champ (MOSFETs)
| Published By | Publication Date | Number of Pages |
| IEC | 2010-04-22 | 20 |
| Published Code | IEC |
|---|---|
| Published By | International Electrotechnical Commission |
| Publication Date | 2010-04-22 |
| Pages Count | 20 |
| Language | France |
| Edition | 1.0 |
| File Size | 870.4 KB |
| ICS Codes | 31.080.30 - Transistors |
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