IEEE 1057 2008

$66.63

IEEE Standard for Digitizing Waveform Recorders

Published By	Publication Date	Number of Pages
IEEE	2008	154

Guaranteed Safe Checkout

Category: IEEE

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

Description

Revision Standard – Active. Revision of IEEE Std 1057-1994. This standard defines specifications and describes test methods for measuring the performance of electronic digitizing waveform recorders, waveform analyzers, and digitizing oscilloscopes with digital outputs. The standard is directed toward, but not restricted to, general-purpose waveform recorders and analyzers. Special applications can require additional manufacturer information and verification tests not covered in this standard. IEEE 1057 has many similarities to IEEE 1241 Standard for Terminology and Test Methods for Analog to Digital Converters (ADCs) . However, IEEE Std. 1057 shall be used for waveform recorders and IEEE Std. 1241 shall be used for ADCs.

PDF Catalog

PDF Pages	PDF Title
1	IEEE Std 1057-2007 Front cover
3	Title page
6	Introduction Notice to users Laws and regulations Copyrights Updating of IEEE documents Errata Interpretations
7	Patents Participants
13	Contents Important notice 1. Overview 1.1 Scope
14	1.2 Purpose 2. Normative references 3. Definitions, symbols, and acronyms 3.1 Definitions
20	3.2 Symbols and acronyms
23	4. Test parameters and methods 4.1 Manufacturer supplied information 4.1.1 General information
24	4.1.2 Performance specifications
25	4.2 Test selection 4.2.1 Step response 4.2.2 Sine fit and harmonic distortion tests
26	4.2.3 Tests at dc 4.3 Test setup 4.3.1 Setting up the recorder
27	4.3.2 Selecting signal sources
28	4.3.3 Connecting signal sources 4.3.4 Terminations 4.3.5 Reducing noise
30	4.3.6 Taking a record of data 4.4 Equivalent-time sampling 4.4.1 Test method for extracting data for single-record equivalent-time sampling method
32	4.4.2 Comments on the extraction method for single-record equivalent-time sampling 4.4.3 Test method for random equivalent-time sampling
33	4.5 Discrete Fourier transform (DFT)
35	4.5.1 Aliasing
37	4.5.2 Windowed DFT and spectral leakage
40	4.5.3 The DFT and a spectrum analyzer display
42	4.6 Sinewave testing and fitting 4.6.1 Sinewaves as test signals 4.6.2 Curve fitting test method 4.6.3 Three-parameter versus four-parameter fit
43	4.6.4 Choice of frequencies and record length
45	4.6.5 Selecting signal amplitudes 4.6.6 Presenting sinewave test data 4.6.7 Impurities of sinewave sources
46	4.6.8 Estimating impurity problems from sine-fitting results
47	4.6.9 Measuring and controlling sinewave impurities
48	4.7 Locating code transition levels
49	4.7.1 Static test method 4.7.2 Locating code transitions using a feedback loop
51	4.7.3 Comment on the significance of record length and the presence of noise
52	4.7.4 Test setup precautions 4.7.5 Test equipment performance 4.7.6 Noise filtering 4.7.7 Software considerations 4.7.8 Sinewave histogram
57	4.7.9 Comments on histogram testing 4.7.10 Triangle wave tests
65	4.8 Step function response measurements 4.8.1 Purposes and limitations of step response measurements
66	4.8.2 Test method for measuring step response 4.8.3 Sources of error
68	4.9 Tests using a dc input 5. Input impedance 5.1 Test method 5.2 Alternate test method using a time domain reflectometer (TDR)
69	5.3 Input impedance for out-of-range signals 5.3.1 Test method
70	5.3.2 Alternate method using time domain reflectometry
71	6. Gain and offset 6.1 Independently based gain and offset 6.1.1 Static test method
72	6.1.2 Dynamic test method 6.1.3 Comment on number of samples required 6.2 Terminal-based gain and offset
73	6.2.1 Test method 7. Linearity 7.1 Integral nonlinearity (INL) 7.1.1 Test method 7.2 Maximum static error (MSE)
74	7.2.1 Test method 7.3 Differential nonlinearity (DNL) and missing codes 7.3.1 Test method
75	7.4 Example INL and DNL data
76	7.5 Monotonicity 7.5.1 Static test method 7.6 Hysteresis 7.6.1 Static test method
77	7.6.2 Comment on hysteresis and alternation 7.7 Total harmonic distortion (THD)
78	7.7.1 Coherent sampling test method
79	7.7.2 Noncoherent sampling test method 1 (windowed DFT)
80	7.7.3 Noncoherent sampling test method 2 (sine fitting)
81	7.7.4 Comments record lengths, sample rate, and input frequency for noncoherent sampling using curve fitting
82	7.8 Intermodulation distortion (IMD) 7.8.1 Two-tone intermodulation test method
84	7.8.2 Multi-tone IMD 7.9 Noise power ratio (NPR) 7.9.1 Test method for NPR
89	8. Noise 8.1 Comments on noise 8.2 Ratio of signal to noise and distortion (SINAD) 8.2.1 Test method
90	8.2.2 Coherent sampling test method for SINAD in the frequency domain 8.3 Signal to noise ratio (SNR)
91	8.3.1 Test method for SNR using coherent sampling 8.3.2 Test method 1 for SNR using noncoherent sampling 8.3.3 Test method 2 for SNR using noncoherent sampling 8.4 Comments on SINAD and SNR
92	8.5 Effective number of bits (ENOB) 8.5.1 Test method for ENOB
93	8.5.2 Comment on ideal quantization error 8.5.3 Comment on the relationship of SINAD and ENOB
94	8.5.4 Comment on significance of record size 8.5.5 Comment on the purity of the input sinewave 8.5.6 Comment on errors included in and omitted from SINAD and ENOB 8.6 Random noise 8.6.1 Test method for random noise
95	8.6.2 Alternate test method for low-noise recorders
96	8.7 Spurious components 8.7.1 Test method 1, with no applied signal 8.7.2 Test method 2, with applied signal
97	8.8 Spurious-free dynamic range (SFDR) 8.8.1 Coherent sampling test method 8.8.2 Noncoherent sampling test method
98	9. Step response parameters 9.1 Settling parameters 9.1.1 Transition settling duration 9.1.2 Settling error 9.1.3 Short-term transition settling duration 9.1.4 Short-term settling error
99	9.1.5 Comments on the choice of settling parameter 9.1.6 Comment on the choice of final value 9.1.7 Comment on the use of filtering to improve transition settling duration measurement
100	9.1.8 Test method for transition settling duration and short-term transition settling duration
101	9.1.9 Alternate test method for recorders not allowing records of 1 s or more 9.1.10 Comment on transition settling duration 9.2 Transition duration of the step response 9.2.1 Test method
102	9.2.2 Comment on pathological test results
103	9.3 Slew rate limit 9.3.1 Test method 9.4 Overshoot and precursors 9.4.1 Test method 9.5 Aperture duration
104	9.5.1 Test method 9.6 Limitations on the use of step responses 9.6.1 Non-ideal step signal 9.6.2 Recorder nonlinearities
105	9.6.3 Lack of time invariance 9.6.4 Noise 9.6.5 Aliasing
106	10. Frequency response parameters 10.1 Analog bandwidth 10.1.1 Test method
107	10.1.2 Alternative method using time domain techniques 10.2 Gain error (gain flatness) 10.3 Frequency response and gain from step response 10.3.1 Test method
108	10.3.2 Comment on aliasing errors
109	10.3.3 Comment on record length 10.3.4 Filtering settling region of step for improved frequency response measurement
111	10.3.5 Effect of jitter on frequency response
112	10.3.6 Non-ideal step signal 11. Interchannel parameters 11.1 Crosstalk 11.1.1 Multichannel crosstalk 11.2 Multiple input reverse coupling 11.2.1 Test method
113	12. Time base parameters 12.1 Fixed error in sample time 12.1.1 Test method 12.2 Aperture uncertainty
114	12.2.1 General test method to determine an upper bound 12.2.2 Alternate test method to determine an upper bound 12.2.3 Alternative test method for recorders that either permit external sampling clocks or port the internal sampling clock to the user
115	12.3 Long-term stability 12.3.1 General test method
116	12.3.2 Alternative test method for recorders that port the internal sampling clock to the user 13. Out-of-range recovery
117	13.1 Test method for absolute out-of-range voltage recovery 13.2 Test method for relative out-of-range voltage recovery 13.3 Comments on test method 14. Word error rate 14.1 Test method
118	14.2 Comment on the number of samples required for word error rate 14.3 Comments on test equipment and making measurements 15. Differential input specifications
119	15.1 Differential input impedance to ground 15.1.1 Test method 15.2 Common-mode rejection ratio (CMRR) and maximum common-mode signal level 15.2.1 Test method 15.3 Maximum operating common-mode signal 15.3.1 Test method
120	15.4 Common-mode out-of-range signal recovery time 15.4.1 Test method 16. Cycle time 16.1 Test method
121	16.2 Comment 17. Triggering 17.1 Trigger delay and trigger jitter 17.1.1 General test method 17.1.2 Alternate test method for recorders with pretrigger capability 17.1.3 Comment on the inherent jitter associated with test methods
122	17.2 Trigger sensitivity 17.2.1 Test methods
123	17.3 Trigger minimum rate of change 17.3.1 Test method 17.4 Trigger coupling to signal 17.4.1 Test method 17.4.2 Comment
124	Annex A (informative) Sine fitting algorithms A.1 Algorithm for three-parameter (known frequency) least squares fit to sinewave data using matrix operations
125	A.2 Algorithm for four-parameter (general use) least squares fit to sinewave data using matrix operations
128	Annex B (informative) Phase noise B.1 What is phase noise?
130	B.2 Phase noise measurements B.3 Phase noise effect on test results
131	B.3.2 Time jitter
132	B.3.3 Frequency error
133	B.4 Phase noise effects on specific tests B.4.1 Histogram tests
135	B.4.2 Step response measurements B.4.3 Sinewave tests
136	Annex C (informative) Comment on errors associated with word-error-rate measurement
138	Annex D (informative) Measurement of random noise below the quantization level D.1 Derivation of equations
140	D.2 Alternate approach using a servo loop
141	Annex E (informative) Software considerations E.1 Motivation E.2 Test of software to fit waveforms E.3 Test of DFT software E.4 Software toolkit
142	Annex F (informative) Excitation with precision source with ramp vernier: determination of the test parameters F.1 Triangular wave amplitude (A)
143	F.2 DC source output voltages (Vj)
144	F.3 Number of samples (K and M) and triangular wave frequency (f)
145	Annex G (informative) Presentation of sinewave data G.1 ENOB presentation
146	G.2 Presentation of residuals
147	G.3 Other examples of presentations of sinewave test results
152	Annex H (informative) Bibliography