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IEEE 1139 2009

$46.04

IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology–Random Instabilities

Published By Publication Date Number of Pages
IEEE 2009 45
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Revision Standard – Active. Methods of describing random instabilities of importance to frequency and time metrology are covered in this standard. Quantities covered include frequency, amplitude, and phase instabilities; spectral densities of frequency, amplitude, and phase fluctuations; and time-domain deviations of frequency fluctuations. In addition, recommendations are made for the reporting of measurements of frequency, amplitude and phase instabilities, especially as regards the recording of experimental parameters, experimental conditions, and calculation techniques.

PDF Catalog

PDF Pages PDF Title
1 IEEE Std 1139-2008 Front cover
3 Title page
6 Introduction

Notice to users

Laws and regulations

Copyrights
7 Updating of IEEE documents

Errata

Interpretations

Patents
8 Participants
9 Contents
11 Important notice
1. Scope
12 2. Definitions
3. Standards for characterizing or reporting measurements of frequency, amplitude, and phase instabilities
13 3.1 Nonrandom phenomena should be recognized
3.2 Relevant measurement or specification parameters should be given
14 Annex A (informative)Measures of frequency, amplitude, and phase instabilities
A.1 Measures of frequency, amplitude, and phase instabilities
15 A.2 Frequency domain
18 A.3 Time domain
22 A.4 Systematic instabilities
A.5 Clock-time prediction
24 Annex B (informative)Power-laws and conversion between frequency and time domain
B.1 Power-law spectral densities
26 B.2 Conversion between frequency and time domain
28 Annex C (informative)Examples of computation of deviations
C.1 Introduction
C.2 Allan deviation (y(() examples
31 C.3 Modified Allan deviation Mod (y(() example
32 C.4 Total deviation example
34 Annex D (informative)Other variances deviations that have been used to describe frequency instabilities in the time domain
36 Annex E (informative)Confidence limits of measurements
40 Annex F (informative)Bibliography
IEEE 1139 2009
$46.04