IEEE 1149.4 2011

$106.17

IEEE Standard for a Mixed-Signal Test Bus

Published By	Publication Date	Number of Pages
IEEE	2011	116

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Description

Revision Standard – Active. The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to, both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration. Also, extensions to the standard BSDL are defined that allow description of key component-specific aspects of such testability features.

PDF Catalog

PDF Pages	PDF Title
1	IEEE Std 1149.4-2010 Front Cover
3	Title page
6	Introduction Notice to users Laws and regulations Copyrights Updating of IEEE documents
7	Errata Interpretations Patents
8	Participants
9	Contents
11	Important notice 1. Overview 1.1 Organization of the standard
12	1.2 Context
13	1.3 Scope
16	1.4 Background reading 2. Normative references 3. Definitions, acronyms, abbreviations, and voltage symbols 3.1 Definitions
20	3.2 Acronyms and abbreviations
21	3.3 Voltage source symbols 4. Testability architecture 4.1 Overview
23	4.2 TAP controller
24	4.3 ATAP
25	4.4 Register architecture
26	5. Instructions 5.1 General
27	5.2 Response of test logic to instructions 5.3 Mandatory instructions
30	5.4 Optional instructions
35	6. The TBIC 6.1 General
36	6.2 Test bus and TBIC structure
40	6.3 Control of the TBIC
43	6.4 Differential I/O
44	6.5 Partitioned internal test bus structure
48	7. The boundary-scan structure 7.1 Structure
49	7.2 DBMs
51	7.3 ABMs
61	7.4 Differential ABMs
67	8. Measurement methodology 8.1 Interconnect testing
70	8.2 Extended interconnect testing
74	8.3 Network measurements
75	9. Analog parametric limits 9.1 General 9.2 Switch limitations
76	9.3 Electrostatic protection
77	9.4 Performance specifications
79	9.5 Measuring performance
86	9.6 Calibration and errors
88	10. Conformance and documentation requirements 10.1 Conformance
89	10.2 General documentation
92	10.3 Documentation of residual elements
94	10.4 BSDL Documentation
116	Annex A (informative) Bibliography