IEEE 1149.8.1 2012
$43.33
IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components
| Published By | Publication Date | Number of Pages |
| IEEE | 2012 | 95 |
New IEEE Standard – Active. Extensions to IEEE Std 1149.1(TM) that define the boundary-scan structures and methods required to facilitate boundary-scan-based stimulus of interconnections to passive and/or active components are specified. Such networks are not adequately addressed by existing standards, including those networks that are ac-coupled or differential. The selective ac stimulus generation enabled by this standard, when combined with non-contact signal sensing, will allow testing of the connections between devices adhering to this standard and circuit elements such as series components, sockets, connectors, and integrated circuits (ICs) that do not implement IEEE Std 1149.1. This standard also specifies Boundary-Scan Description Language (BSDL) extensions to IEEE Std 1149.1 required to describe and support the new structures and methods.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | IEEE Std 1149.8.1-2012 Front cover |
| 3 | Title page |
| 6 | Notice to users Laws and regulations Copyrights Updating of IEEE documents Errata Patents |
| 8 | Participants |
| 10 | Introduction |
| 11 | Contents |
| 13 | Important notice 1. Overview 1.1 Scope 1.2 Purpose |
| 14 | 1.3 Context |
| 15 | 1.4 Organization of the standard 2. Normative references |
| 16 | 3. Definitions |
| 18 | 4. Technology 4.1 Evolution of printed circuit assembly technology 4.2 Shifts in board testing challenges |
| 19 | 4.3 Signal pin types |
| 24 | 4.4 Defects targeted by the standard |
| 27 | 4.5 Selective toggle theory of operation |
| 33 | 5. Instructions 5.1 IEEE 1149.1 instructions |
| 34 | 5.2 Additional instructions added by this standard 5.3 TOGGLE_SETUP instruction |
| 35 | 5.4 SELECTIVE_TOGGLE instruction |
| 37 | 6. Pin implementation specifications 6.1 Pin classification |
| 38 | 6.2 Implementation of normal pins |
| 40 | 6.3 Implementation of ST-pins |
| 59 | 6.4 Toggle behavior for ST-pins |
| 61 | 7. Toggle_Control register |
| 62 | 7.1 Rules 7.2 Permissions 7.3 Recommendations |
| 63 | 7.4 Description |
| 66 | 8. Conformance and documentation requirements 8.1 Conformance |
| 67 | 8.2 Documentation |
| 68 | 8.3 BSDL package for Selective Toggle description (STD_1149_8_1_2012) |
| 70 | 8.4 BSDL extension structure |
| 71 | 8.5 BSDL attribute definitions |
| 75 | 8.6 Example BSDL |
| 85 | Annex A (informative) Unpowered testing for open connections on printed circuit assemblies A.1 Problem description A.2 Unpowered capacitive opens detection |
| 89 | A.3 Replacing tester ac stimulus with boundary-scan stimulus |
| 90 | A.4 Coverage deficiencies |
| 92 | Annex B (informative) Boundary register cells that support ST-pins and IEEE 1149.6 ac-pins |
| 94 | Annex C (informative) Bibliography |
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