IEEE 1241-2023

$81.79

IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters (Approved Draft)

Published By	Publication Date	Number of Pages
IEEE	2023	143

Guaranteed Safe Checkout

Category: IEEE

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

Description

Revision Standard – Active. The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values are extracted (sampled) and then digitized at known time intervals. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.

PDF Catalog

PDF Pages	PDF Title
1	IEEE Std 1241-2023 Front Cover
2	Title page
4	Important Notices and Disclaimers Concerning IEEE Standards Documents Notice and Disclaimer of Liability Concerning the Use of IEEE Standards Documents Translations
5	Official statements Comments on standards Laws and regulations Data privacy Copyrights
6	Photocopies Updating of IEEE Standards documents Errata Patents
7	IMPORTANT NOTICE
8	Participants
9	Introduction
10	Acknowledgements
11	Contents
13	1. Overview 1.1 Scope 1.2 Purpose 1.3 Word usage
14	1.4 Document organization 1.5 Analog-to-digital converter background
18	1.6 Guidance to the user 1.6.1 Interfacing 1.6.2 Test conditions
19	1.6.3 Electrical environment 1.6.4 Test equipment 1.6.5 Test selection 1.7 Manufacturer-supplied information 1.7.1 General information
20	1.7.2 Minimum specifications 1.7.3 Additional specifications
21	1.7.4 Pertinent ADC parameters
23	2. Normative references 3. Definitions, acronyms, and abbreviations 3.1 Definitions
31	3.2 Acronyms, abbreviations, and symbols 3.2.1 Acronyms, abbreviations, and operators
32	3.2.2 Symbols
37	4. General test methods 4.1 Introductory information on test methods 4.2 Test setup 4.2.1 Sine-wave test setup
38	4.2.2 Arbitrary signal test setup 4.2.3 Step signal setup
39	4.3 Taking a record of data 4.3.1 Use of output decimation in taking a record of data 4.4 Equivalent-time sampling and undersampling
40	4.4.1 Extraction method
41	4.4.2 Comments on the extraction method for equivalent-time sampling
42	4.4.3 Alternate extraction method
43	4.4.4 Comments on alternate extraction method
44	5. Sine-wave testing and fitting 5.1 Introductory information on sine-wave testing and fitting 5.2 Curve fitting test method
45	5.3 Comment on three-parameter versus four-parameter sine fit
46	5.4 Choice of frequencies and waveform epoch 5.4.1 Fine-scale frequency selection
47	5.4.2 Medium-scale frequency selection 5.4.3 Coarse-scale frequency selection
48	5.4.4 Special considerations with very long waveform epochs 5.5 Selecting signal amplitudes 5.6 Presenting sine-wave data 5.7 Impurities of sine-wave sources
49	5.8 Estimating impurity problems from sine-fitting results
50	5.9 Measuring and controlling sine-wave impurities
51	6. Locating code transitions 6.1 Introductory information on locating code transitions 6.2 Locating code transitions using a feedback loop
52	6.2.1 Test method for locating code transitions using a feedback loop
54	6.3 Alternate code transition location method based on ramp histogram
55	6.3.1 Comments on number of samples to be averaged per CTL for a given confidence level 6.3.2 Comments on ramp characteristics 6.3.3 Comments on histogram testing 6.4 Alternate code transition location method, based on sine-wave histogram
56	6.4.1 Tolerance and confidence level
57	6.4.2 Comment on the selection of the sine-wave frequency and waveform epoch
58	6.4.3 Comments on sine-wave histogram testing 6.4.4 Comment on the amount of sine-wave overdrive and the number of waveforms epochs required 6.4.4.1 Input overdrive and required number of waveforms
60	6.5 Determining the static transfer curve 6.5.1 Alternate method for determining the static transfer curve
61	7. Analog input 7.1 Input characteristics 7.1.1 Static input resistance 7.2 Static input impedance versus input signal level 7.2.1 Test method for static input impedance 7.3 Static input current 7.4 Static gain and offset 7.4.1 Static gain and offset (independently based)
62	7.4.1.1 Alternate method for determining gain and offset 7.4.2 Static gain and offset (terminal based)
63	8. Linearity 8.1 General comments on linearity 8.2 Integral nonlinearity 8.2.1 Integral nonlinearity test method
64	8.2.2 Alternate test method for determining INL 8.3 Absolute accuracy error 8.3.1 Test method for absolute accuracy error 8.4 Differential nonlinearity and missing codes
65	8.4.1 Differential nonlinearity and missing codes test method 8.5 Example INL and DNL data
67	8.6 Monotonicity 8.6.1 Test method for monotonicity 8.7 Hysteresis 8.7.1 Hysteresis test method
68	8.7.2 Alternate hysteresis test method 8.7.3 Comment on hysteresis and alternation
69	8.8 Harmonic and spurious distortion 8.8.1 Total harmonic distortion
70	8.8.1.1 Coherent sampling THD test method 8.8.1.2 Noncoherent sampling test method 1 (windowed DFT)
71	8.8.1.3 Noncoherent sampling test method 2 (sine fitting)
72	8.8.1.4 Comments on waveform lengths, sample rate, and input frequency for noncoherent sampling using curve fitting
73	8.8.2 Spurious free dynamic range 8.8.2.1 Coherent sampling SFDR test method
74	8.8.2.2 Noncoherent SFDR sampling test method 8.9 Intermodulation distortion 8.9.1 Intermodulation distortion test method using two tones
75	8.9.1.1 Comments on test procedure 8.9.1.2 Additional comments
76	8.9.2 Intermodulation distortion test methods using more than two tones 8.9.2.1 Multi-tone power ratio
77	8.9.2.2 MTPR test method
78	8.9.2.3 Comments on MTPR 8.10 Noise power ratio 8.10.1 Test method for noise power ratio
80	8.10.2 NPR testing issues 8.10.2.1 Input signal filtering 8.10.2.2 Notch filter width 8.10.2.3 Windowing 8.10.2.4 Measured and theoretical NPR
81	8.10.2.5 Comments on NPR
83	9. Noise (total) 9.1 General comments concerning noise 9.2 Signal-to-noise-and-distortion ratio (SINAD) 9.2.1 SINAD test method
84	9.2.2 Coherent sampling test method for SINAD in the frequency domain 9.2.3 Comments on SINAD and SNR 9.3 Signal-to-noise ratio (SNR) 9.3.1 Coherent sampling test method for SNR
85	9.3.2 Noncoherent sampling test method 1 (windowed DFT) 9.3.3 Noncoherent sampling test method 2 (sine fitting) 9.4 Effective number of bits (ENOB) 9.4.1 Comment on ideal quantization error 9.4.2 Comment on the relationship of SINAD and ENOB
86	9.4.3 Comment on significance of number of samples, M 9.4.4 Comment on effects of jitter or phase noise on sine-wave tests
87	9.5 Random noise 9.5.1 Test method for random noise
88	9.5.2 Alternative test method for low noise ADCs 9.5.2.1 Note on amplitude of triangle wave used for test 9.5.2.2 Note on desired accuracy
89	9.5.3 Alternative random noise and hysteresis test method based on a feedback loop 10. Step response parameters 10.1 Step response definition
90	10.2 Test method for acquiring an estimate of the step response 10.2.1 Comment on test results 10.3 Slew rate limit 10.3.1 Test method
91	10.4 Settling time parameters 10.4.1 Settling time 10.4.2 Short-term settling time 10.4.3 Long-term settling error 10.4.4 Test method for settling time and short-term settling time
92	10.4.5 Comment on settling time 10.5 Transition duration of step response 10.5.1 Test method for transition duration 10.6 Overshoot and precursors 10.6.1 Test method for overshoot and precursors 11. Frequency response parameters 11.1 Bandwidth
93	11.1.1 Bandwidth test method
94	11.1.2 Alternative bandwidth test method using time domain techniques 11.1.3 Useful power bandwidth test method
95	11.2 Gain error (gain flatness) 11.3 Frequency response and gain from step response 11.3.1 Frequency response and dynamic gain test method
96	11.3.2 Aliasing and first differencing error bounds
97	11.3.3 Comment on frequency response tests 12. Differential gain and phase 12.1 Introductory information on differential gain and phase
98	12.2 Method for testing a general-purpose ADC
100	12.2.1 Method for neglecting phase adjustment factor
101	12.3 Comments on differential phase and differential gain testing 13. Sampling aperture effects 13.1 Introductory information on sampling aperture effects 13.2 Aperture duration
106	13.2.1 Test method for aperture duration 13.2.2 Comment on selecting the value of p 13.3 Aperture delay
107	13.3.1 Test method for aperture delay 13.3.2 Comment on aperture delay 13.4 Aperture uncertainty 13.4.1 Test method for aperture uncertainty
109	14. Additional tests and specification 14.1 Digital logic signals
110	14.2 Pipeline delay 14.3 Out-of-range recovery interval 14.3.1 Test method for absolute out-of-range recovery 14.3.2 Test method for relative out-of-range recovery
111	14.3.3 Comments on test methods 14.4 Differential input specifications 14.4.1 Input impedance to ground (for differential input ADCs) 14.4.1.1 Test method 14.4.2 Common-mode rejection ratio (CMRR) and maximum common-mode signal level
112	14.4.2.1 Test method for CMRR 14.4.3 Maximum operating common-mode signal 14.4.3.1 Test method for maximum operating common-mode signal
113	14.4.4 Common-mode out-of-range recovery interval 14.4.4.1 Test method for common-mode out-of-range recovery time 14.5 Comments on reference signals 14.6 Power supply parameters 14.6.1 Power consumption
114	14.6.1.1 Power consumption test method 14.6.1.2 Power supply voltage effects 14.6.1.3 Power supply voltage effects test method
115	14.6.1.4 Comments on power supply rejection ratio (PSRR)
116	Annex A (informative) ADC architectures A.1 Integrating ADCs A.2 Flash ADCs
117	A.3 Pipelined and subranging ADCs
119	A.4 SAR ADCs
120	A.5 Σ-∆ ADCs A.6 Time-interleaved ADCs
121	A.7 Folding and interpolating ADCs
123	Annex B (informative) Sine-wave fitting algorithms B.1 Algorithm for three-parameter (known frequency) least-squares fit to sine-wave data
124	B.2 Algorithm for four-parameter least-squares fit to sine-wave data
126	Annex C (normative) Discrete Fourier transforms and windowing
128	C.1 Windowed DFT and spectral leakage C.1.1 Spectral leakage
129	C.1.2 Coherent sampling and sine-fitting methods of reducing spectral leakage
130	C.2 Some useful windows and their characteristics
131	C.3 Window selection
132	Annex D (informative) Presentation of sine-wave data D.1 ENOB presentation
133	D.2 Presentation of residuals
135	D.3 Other examples of presentations of sine-wave test results
139	Annex E (informative) Bibliography
143	Back Cover

Additional information

Standard Title	IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters (Approved Draft)
Published Code	IEEE
Publication Date	2023
Pages Count	143

Preview PDF


PDF Format	Searchable	Printable	Preview Now

IEEE 1241-2023

PDF Catalog

Related products