IEEE 1445 1998:1999 Edition

$57.96

IEEE Standard for Digital Test Interchange Format (DTIF)

Published By	Publication Date	Number of Pages
IEEE	1999	105

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Description

New IEEE Standard – Active. The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are dened. This information can be broadly grouped into data that denes the following: UUT Model, Stimulus and Response, Fault Dictionary, and Probe.

PDF Catalog

PDF Pages	PDF Title
1	Titlepage
3	Introduction
5	CONTENTS
7	1. Overview 1.1 Scope 1.2 Purpose 1.3 Application
8	2. References 3. Definitions and acronyms 3.1 Definitions
10	3.2 Acronyms 4. Data organization overview of the DTIF standard environment
11	4.1 UUT Model Group 4.2 Stimulus and Response Group 4.3 Fault Dictionary Group 4.4 Probe Group
12	5. File specifications
13	5.1 HEADER file
15	5.2 STIMULUS file
16	5.3 PO_RESPONSE file
17	5.4 PI_NAMES file
18	5.5 PO_NAMES file
19	5.6 MAIN_MODEL file
20	5.7 COMPONENT_TYPE file
21	5.8 USER_NODE file
22	5.9 INPUT_PIN_NAMES file
23	5.10 OUTPUT_PIN_NAMES file
24	5.11 NEAR_FROMS_POINTERS file
25	5.12 NEAR_FROMS file
26	5.13 EVENT file
28	5.14 SETTLED_STATE_ONLY file
29	5.15 SETTLED_STATE_&_PULSES file
31	5.16 NODE_SOURCE file
32	5.17 STEPS file
33	5.18 F.D._POPATS file
34	5.19 F.D._FAULT_SIGNATURES file
36	5.20 F.D._PRINT_STRINGS file
38	5.21 TRISTATE_FROMS_POINTERS file
39	5.22 TRISTATE_FROMS file
40	5.23 PSEUDOPI_NAMES file
41	5.24 TIMING_SETS file
43	5.25 TIMING_PER_PATTERN file
44	5.26 PHASE_CONNECTIONS file
45	5.27 AUXILIARY_PIN_NAMES file
46	5.28 PI_FORMATS file
47	5.29 FORMAT_ATTRIBUTES file
48	5.30 F.D. _CROSS_REFERENCE file
49	5.31 PROBETAG_ DEFINITIONS file
51	5.32 PROBETAG_ASSIGNMENTS file
52	5.33 BURSTS file
53	5.34 STIMULUS_TEXT file
54	5.35 NODE_NAMES file
55	5.36 EVENTS_INIT file
57	5.37 EQUIV_FAULTS file
58	5.38 PROBE_DETECTION file
59	5.39 F.D._EQUIV_SETS file
60	6. Conformance 6.1 End-to-end test 6.2 Diagnostic test using fault dictionary
62	6.3 Diagnostic test using probe
65	Annex A. Implementation overview
67	Annex B. DTIF dependency diagrams
72	Annex C. Example circuit