IEEE 1450-2023

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IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data (Published)

Published By	Publication Date	Number of Pages
IEEE	2023	147

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Description

Revision Standard – Active. Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined in this standard that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.

PDF Catalog

PDF Pages	PDF Title
1	IEEE Std 1450™-2023 Front cover
2	Title page
4	Important Notices and Disclaimers Concerning IEEE Standards Documents
8	Participants
9	Introduction
10	Contents
14	List of figures
15	List of tables
16	1. Overview
17	1.1 Scope
18	1.2 Purpose
19	1.3 Word usage 2. Normative references
20	3. Definitions, acronyms, and abbreviations 3.1 Definitions
22	3.2 Acronyms and abbreviations
23	4. Structure of this standard 5. STIL orientation and capabilities tutorial 5.1 General 5.2 Hello tester
28	5.3 Basic LS245
32	5.4 STIL timing expressions/”Spec” information
35	5.5 Structural test (scan)
38	5.6 Advanced scan
44	5.7 IEEE Std 1149.1™-1990
48	5.8 Multiple data elements per test cycle
51	5.9 Pattern reuse/direct access test
54	5.10 Event data/non-cyclized STIL information
63	6. STIL syntax description 6.1 General 6.2 Case sensitivity 6.3 Whitespace 6.4 Reserved words
64	6.5 Reserved characters
66	6.6 Comments 6.7 Token length 6.8 Character strings 6.9 User-defined name characteristics
67	6.10 Domain names
68	6.11 Signal and group name characteristics 6.12 Timing name constructs 6.13 Number characteristics
69	6.14 Timing expressions and units (time_expr)
71	6.15 Signal expressions (sigref_expr)
72	6.16 WaveformChar characteristics
73	6.17 STIL name spaces and name resolution
74	7. Statement structure and organization of STIL information
75	7.1 Top-level statements and required ordering
77	7.2 Optional top-level statements 7.3 STIL files 8. STIL statement 8.1 General
78	8.2 STIL syntax 8.3 STIL example 9. Header block 9.1 General 9.2 Header block syntax
79	9.3 Header example 10. Include statement 10.1 General 10.2 Include statement syntax
80	10.3 Include example 10.4 File path resolution with absolute path notation 10.5 File path resolution with relative path notation 11. UserKeyWords statement 11.1 General
81	11.2 User Keywords statements syntax 11.3 User Keywords example 12. UserFunctions statement 12.1 General 12.2 UserFunctions statement syntax
82	12.3 UserFunctions example 13. Ann statement 13.1 General 13.2 Annotations statement syntax 13.3 Annotations example 14. Signals block 14.1 General
83	14.2 Signals block syntax
85	14.3 Signals block example
86	15. SignalGroups block 15.1 General 15.2 SignalGroups block syntax
87	15.3 SignalGroups block example 15.4 Default attributes value
88	15.5 Translation of based data into WaveformChar characters
89	16. PatternExec block 16.1 General 16.2 PatternExec block syntax
90	16.3 PatternExec block example 17. PatternBurst block 17.1 General 17.2 PatternBurst block syntax
92	17.3 PatternBurst block example 18. Timing block and WaveformTable block 18.1 General
93	18.2 Timing and WaveformTable syntax
96	18.3 Waveform event definitions
99	18.4 Timing and WaveformTable example
100	18.5 Rules for timed event ordering and waveform creation
102	18.6 Rules for waveform inheritance
103	19. Spec and Selector blocks 19.1 General
104	19.2 Spec and selector block syntax
105	19.3 Spec and selector block example
106	20. ScanStructures block 20.1 General
107	20.2 ScanStructures block syntax
108	20.3 ScanStructures block example
109	21. STIL Pattern data 21.1 General 21.2 Cyclized data
110	21.3 Multi-bit cyclized data
111	21.4 Non-cyclized data 21.5 Scan data
112	21.6 Pattern labels 22. STIL Pattern statements 22.1 Vector (V) statement
113	22.2 WaveformTable (W) statement 22.3 Condition (C) statement
114	22.4 Call statement 22.5 Macro statement 22.6 Loop statement
115	22.7 MatchLoop statement
116	22.8 Goto statement 22.9 BreakPoint statements 22.10 IDDQTestPoint statement
117	22.11 Stop statement 22.12 ScanChain statement 22.13 FreeRunningClockStart statement
118	22.14 FreeRunningClockStop statement 23. Pattern block 23.1 General 23.2 Pattern block syntax 23.3 Pattern initialization
119	23.4 Pattern examples 24. Procedures and MacroDefs blocks 24.1 General
120	24.2 Procedures block
121	24.3 Procedures example 24.4 MacroDefs block 24.5 Scan testing
122	24.6 Procedure and Macro data substitution
126	24.7 ShiftMultiple 24.8 ShiftMultiple example
128	Annex A (informative) Glossary
129	Annex B (informative) STIL data model
134	Annex C (informative) Binary STIL data format
138	Annex D (informative) LS245 design description
140	Annex E (informative) STIL FAQs and language design decisions
144	Annex F (informative) 2.0 revision updates
146	Annex G (informative) Bibliography
147	Back cover

Additional information

Standard Title	IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data (Published)
Published Code	IEEE
Publication Date	2023
Pages Count	147

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