IEEE 1505.1-2008
$99.67
IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
Published By | Publication Date | Number of Pages |
IEEE | 2008 |
New IEEE Standard – Superseded. This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: (a) pin map configuration; (b) specific connector modules; (c) respective contacts; (d) recommended switching implementation; and (e) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).
PDF Catalog
PDF Pages | PDF Title |
---|---|
1 | IEEE Std 1505.1™-2008 |
3 | Title page |
6 | Introduction Notice to users Laws and regulations Copyrights |
7 | Updating of IEEE documents Errata Interpretations Patents |
8 | Participants |
10 | Contents |
11 | Important notice 1. Overview 1.1 Scope |
12 | 1.2 Purpose 1.3 Statement of the problem |
13 | 2. Normative references |
14 | 3. Definitions, acronyms, and abbreviations 3.1 Definitions 3.2 Specification terms 3.3 Acronyms and abbreviations |
18 | 4. Common test interface requirements 4.1 Introduction 4.2 CTI open system requirements |
19 | 4.3 CTI cost requirements 4.4 Vertical integration test support requirements |
20 | 4.5 CTI configuration/interoperability requirements 4.6 Maintainability/end-user support requirements 4.7 Scaleable architecture requirements |
22 | 4.8 Physical framework requirements |
27 | 4.9 Reliability requirements |
28 | 4.10 CTI connector footprint/parametric requirements |
32 | 4.11 CTI pin map requirements |
43 | 4.12 CTI pin map input/output configuration |
44 | Annex A (normative) Common test interface signal definitions for pin map A.1 Analog instruments (AI) |
46 | A.2 Bus |
47 | A.3 Digital A.4 Instrument control A.5 Power loads |
48 | A.6 Power supplies A.7 Sense and control, DCPS, and loads |
49 | A.8 Switch |
50 | A.9 System |
169 | Annex B (informative) Bibliography |