IEEE 1546 2001
$53.08
IEEE Guide for Digital Test Interchange Format (DTIF) Application
| Published By | Publication Date | Number of Pages |
| IEEE | 2001 | 38 |
New IEEE Standard – Active. An aid in the understanding and use of digital test interchange format (DTIF) files isprovided in this guide. This information will be an aid to users in developing tools such aspreprocessors and postprocessors of DTIF data and other utilities.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | Title Page |
| 3 | Introduction Participants |
| 5 | CONTENTS |
| 7 | 1. Overview 1.1 Scope 1.2 Purpose 2. References |
| 8 | 3. Definitions of terms and acronyms 3.1 Terms 3.2 Acronyms 4. DTIF functional groups |
| 10 | 4.1 UUT Model group |
| 14 | 4.2 Stimulus and Response group |
| 18 | 4.3 Fault Dictionary group |
| 19 | 4.4 Probe group |
| 22 | 5. DTIF application example |
| 23 | 5.1 Application example – UUT Model group |
| 28 | 5.2 Application example—Stimulus and Response group |
| 32 | 5.3 Application example—Fault Dictionary group |
| 35 | 5.4 Application example—Probe group |
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