IEEE 1641.1-2006

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IEEE Guide for the Use of IEEE Std 1641, Standard for Signal and Test Definition

Published By	Publication Date	Number of Pages
IEEE	2006	201

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Description

New IEEE Standard – Superseded. Guidance in the use of the signal and test definition (STD) standard is provided. STD provides the means to define and describe signals used in testing. This guide describes how to implement, apply, and use a set of common basic signals to form complex signals usable across all test platforms.

PDF Catalog

PDF Pages	PDF Title
1	IEEE Guide for the Use of IEEE Std 1641, Standard for Signal and Test Definition
3	Title page
6	Introduction Notice to users
7	Participants
9	CONTENTS
11	1. Overview 1.1 Scope 1.2 Purpose 2. Normative references
12	3. Definitions, acronyms, and abbreviations 3.1 Definitions
13	3.2 Acronyms and abbreviations
14	4. Historical background 4.1 Review of ATLAS 4.2 Decision to define a new standard 4.3 Requirements for STD standard
15	4.4 Inclusion of support for Automatic Test Markup Language (ATML) 5. Features of the STD standard 6. Hierarchy of signal definitions
17	7. Process overview 7.1 General 7.2 TSF model as signal template
20	7.3 Typical TSF model
21	7.4 Using TSFs in test requirement or program
22	7.5 Signal measurement 8. Creating signals using STD standard 8.1 Overview
25	8.2 Physical types
26	8.3 Signals
30	8.4 Using signal graphs to create a signal
34	8.5 Documenting signal descriptions
39	8.6 Test requirement capture
48	8.7 Using TPL to create test requirements
69	9. Defining measurements with STD 9.1 General
71	9.2 Sensors
74	9.3 Measurement maps
75	9.4 Generic measurement
78	9.5 Intrinsic measurements
80	9.6 Different valid measurement methods
83	9.7 Reference signals description
84	10. Basic signal components (BSCs) 10.1 Introduction of new BSCs 10.2 BSC interfaces
85	10.3 Diagrammatic representation of BSCs
87	10.4 SignalFunctions and events
103	11. Test Signal Framework (TSF) 11.1 Introduction to TSF 11.2 Building TSF signal models using BSCs 11.3 Examples of source signal models
112	11.4 Signal models with preset internal attributes
116	11.5 Examples of signal models that process input signal
121	11.6 Example of signal models that include connection BSCs
124	11.7 SignalDelay TSF model for SWEEP
126	11.8 TSF model for linear sweep using frequency modulation (FM) BSC
127	11.9 TSF model for logarithmic sweep using FM BSC
128	11.10 TSF attributes mappings and formulae
129	11.11 Synchronization of signal model
139	11.12 Gating a signal model
141	11.13 Use of XML to specify TSF signal model information
151	11.14 Use of IDL to specify TSF signal model information
155	12. Test Procedure Language (TPL) 12.1 Introduction to TPL
156	12.2 Use of ATLAS with STD 12.3 Simple test requirement in TPL
164	12.4 Further test requirement in TPL
172	12.5 Examples of test statements in TPL
181	12.6 Quantities, units, and unit symbols
182	13. Signal Modeling Language (SML)
183	13.1 Introduction to SML 13.2 Using SML to define a BSC
189	Annex A (informative) Glossary
191	Annex B (informative) Generic measurement
198	Annex C (informative) Implementation examples
200	Annex D (informative) Bibliography