IEEE 1641.1 2013

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IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition

Published By	Publication Date	Number of Pages
IEEE	2013	324

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Description

Revision Standard – Active. Guidance in the use of the signal and test definition (STD) standard, IEEE Std 1641-2010, is provided. IEEE Std 1641 provides the means to define and describe signals used in testing. This guide describes how to form complex signals usable across all test platforms.

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PDF Pages	PDF Title
1	IEEE Std 1641.1-2013 Front cover
3	Title page
6	Notice to users Laws and regulations Copyrights Updating of IEEE documents Errata Patents
8	Participants
10	Introduction
11	Contents
15	Important notice 1. Overview 1.1 Scope 1.2 Purpose
16	2. Normative references 3. Definitions, acronyms, and abbreviations 3.1 Definitions
18	3.2 Acronyms and abbreviations
19	4. Introduction to IEEE Std 1641 4.1 Requirements for signal and test definition standard
20	4.2 Features of the standard 4.3 Hierarchy of signal definitions
22	4.4 Improvements to the standard 4.5 Signals and streams
25	4.6 Inclusion of support for Automatic Test Markup Language 5. Describing signals using IEEE Std 1641 5.1 Overview
27	5.2 Physical types
29	5.3 Signals
33	5.4 Using signal graphs to create a signal
37	5.5 Documenting signal descriptions
42	5.6 Using signal definitions 6. Signal models 6.1 General
43	6.2 TSF model as signal template
45	6.3 Typical signal model (TSF)
47	6.4 Using TSFs in a test requirement or program
48	6.5 Measurement models (signal measurement) 7. Defining measurements with STD 7.1 General
49	7.2 Sensors
54	7.3 Measurement maps 7.4 Intrinsic measurements
63	7.5 Generic measurement
67	7.6 Reference signals description 7.7 Different valid measurement methods
70	8. Describing tests and test requirements 8.1 Structure—sequence and signals
71	8.2 Using tools such as graphical environments
72	8.3 Portable test requirements
81	8.4 ATML Test Description 8.5 Examples of test requirements using TPL, ATLAS, and native languages
105	9. Basic signal components 9.1 Introduction of new BSCs 9.2 BSC interfaces
106	9.3 Diagrammatic representation of BSCs
107	9.4 SignalFunctions and events
120	10. Test signal framework 10.1 Introduction to test signal framework (TSF) 10.2 Building TSF signal models using BSCs 10.3 Examples of source signal models
128	10.4 Dual or multiple use TSF models
131	10.5 Signal models with preset internal attributes
135	10.6 Examples of signal models that process input signal
140	10.7 Example of signal models that include connection BSCs
143	10.8 SignalDelay TSF model for SWEEP
144	10.9 TSF model for linear sweep using frequency modulation BSC
145	10.10 TSF model for logarithmic sweep using FM BSC
146	10.11 TSF attributes mappings and formulae
148	10.12 Synchronization of signal model
156	10.13 Gating a signal model
159	10.14 Use of XML to specify TSF signal model information
168	10.15 Use of IDL to specify TSF signal model information
172	11. Digital signals 11.1 Possible states for digital stream
173	11.2 Generating a digital stream
174	11.3 Converting digital data into a physical digital signal
179	11.4 Using the SelectCase BSC
182	11.5 Extracting digital data from a physical digital signal 12. More about events and their interaction 12.1 Interaction between streams
187	12.2 Recovering event information from digital streams
188	13. Test Procedure Language 13.1 Introduction to TPL
189	13.2 Simple test requirement in TPL
197	13.3 Further test requirement in TPL
205	13.4 Examples of test statements in TPL
214	13.5 Quantities, units, and unit symbols
215	14. Signal Modeling Language 14.1 Introduction to SML
216	14.2 Using SML to define a BSC
222	Annex A (informative) Glossary
224	Annex B (informative) Intrinsic measurement B.1 Introduction B.2 Essential aspects and parts of a measurement
228	B.3 Interpreting measurement information
229	B.4 Examples showing breakdown of derivation of attributes
236	B.5 Creating IEEE 1641 measurements for legacy ATLAS systems
240	Annex C (informative) Generic measurement C.1 Introduction C.2 Information required to complete a measurement
241	C.3 Interpreting measurement information
242	C.4 Examples showing breakdown of derivation of attributes
248	C.5 Creating IEEE 1641 measurements for legacy ATLAS systems
250	C.6 Dependence upon reference signal
254	C.7 Measurements on a complex signal (square wave)
256	Annex D (informative) Role of Resource Adapter Information (RAI) in IEEE Std 1641 D.1 Introduction D.2 Maximizing the platform independence of test requirements
257	D.3 Interpreting the principles and rules
258	D.4 Test requirement presentation
259	Annex E (informative) Understanding IEEE 1641 capabilities E.1 How to define and connect loads
269	E.2 Implementing short circuits in IEEE 1641
270	E.3 Signals and triggering
275	Annex F (informative) Implementation of IEEE 1641 application techniques F.1 Implementing IEEE 1641—RF stimulus and measurement
284	F.2 Implementing IEEE 1641—Amplifier characterization using IEEE 1641
296	F.3 Implementing IEEE 1641—Envelope testing of waveforms
306	F.4 Implementing IEEE 1641—Resource drivers and COTS languages
315	F.5 Implementing IEEE 1641—Compilation techniques
323	Annex G (informative) Bibliography

Additional information

Standard Title	IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition
Published Code	IEEE
Publication Date	2013
Pages Count	324

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