IEEE 1641-2010
$239.42
IEEE Standard for Signal and Test Definition
| Published By | Publication Date | Number of Pages |
| IEEE | 2010 |
Revision Standard – Active. This standard provides the means to define and describe signals used in testing. It also provides a set of common basic signals, built upon formal mathematical specifications so that signals can be combined to form complex signals usable across all test platforms. This standard contains additional downloads at http://standards.ieee.org/downloads/1641/1641-2010
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | Cover |
| 3 | Title page |
| 6 | Introduction Notice to users Laws and regulations Copyrights Updating of IEEE documents |
| 7 | Errata Interpretations Patents Participants |
| 9 | Contents |
| 13 | Important notice 1. Overview 1.1 Scope 1.2 Purpose 1.3 Application |
| 14 | 1.4 Annexes 2. Definitions, abbreviations, and acronyms 2.1 Definitions |
| 16 | 2.2 Abbreviations and acronyms |
| 17 | 3. Structure of this standard 3.1 Layers |
| 18 | 3.2 Signal Modeling Language (SML) layer 3.3 BSC layer 3.4 TSF layer 3.5 Test requirement layer |
| 19 | 3.6 Using the layers 4. Signals and SignalFunctions 4.1 Introduction |
| 20 | 4.2 Physical signal states |
| 21 | 4.3 Event states 4.4 Digital stream states |
| 22 | 5. SML layer |
| 23 | 6. BSC layer 6.1 BSC layer base classes 6.2 General description of BSCs |
| 24 | 6.3 SignalFunction template 7. TSF layer |
| 25 | 7.1 TSF classes 7.2 TSF signals defined by a model |
| 26 | 7.2.1 Interface properties table 7.2.2 Model description table |
| 27 | 7.2.3 TSF figures 7.2.4 Other properties |
| 28 | 7.3 TSF signals defined by an external reference 8. Test procedure language (TPL) 8.1 Goals of the TPL 8.2 Elements of the TPL |
| 29 | 8.3 Use of the TPL 9. Maximizing test platform independence |
| 30 | Annex A (normative) Signal modeling language (SML) |
| 77 | Annex B (normative) Basic signal components (BSC) layer |
| 155 | Annex C (normative) Dynamic signal descriptions |
| 165 | Annex D (normative) Interface definition language (IDL) basic components |
| 166 | Annex E (informative) Test signal framework (TSF) for C/ATLAS |
| 247 | Annex F (informative) Test signal framework (TSF) library for digital pulse classes |
| 266 | Annex G (normative) Carrier language requirements |
| 277 | Annex H (normative) Test procedure language (TPL) |
| 312 | Annex I (normative) Extensible markup language (XML) signal descriptions |
| 320 | Annex J (informative) Support for ATLAS nouns and modifiers |
| 332 | Annex K (informative) Guide for maximizing test platform independence and test application interchangeability |
| 335 | Annex L (informative) Bibliography |
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