IEEE 1641-2022

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IEEE Standard for Signal and Test Definition (Approved Draft)

Published By	Publication Date	Number of Pages
IEEE	2022

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Description

Revision Standard – Active. The means to define and describe signals used in testing ae provided in this standard. It also provides a set of common basic signals, built upon formal mathematical specifications so that signals can be combined to form complex signals usable across all test platforms.

PDF Catalog

PDF Pages	PDF Title
1	IEEE Std 1641™-2022 Front Cover
2	Title page
4	Important Notices and Disclaimers Concerning IEEE Standards Documents
8	Participants
9	Introduction
10	Contents
13	1. Overview 1.1 Scope 1.2 Purpose 1.3 Word Usage
14	1.4 Application 1.5 Annexes 2. Definitions, abbreviations, and acronyms 2.1 Definitions
16	2.2 Abbreviations and acronyms
17	3. Structure of this standard 3.1 Layers
18	3.2 Signal Modeling Language (SML) layer 3.3 BSC layer
19	3.4 TSF layer 3.5 Test requirement layer 3.6 Using the layers 4. Signals and SignalFunctions 4.1 Introduction
20	4.2 Physical signal states
21	4.3 Event states
22	4.4 Digital stream states
23	5. SML layer
24	6. BSC layer 6.1 BSC layer base classes 6.2 General description of BSCs
25	6.3 SignalFunction template
26	7. TSF layer 7.1 TSF classes
27	7.2 TSF signals defined by a model
29	7.3 TSF signals defined by an external reference 8. Test procedure language (TPL) 8.1 Goals of the TPL
30	8.2 Elements of the TPL 8.3 Use of the TPL 9. Maximizing test platform independence
31	Annex A (normative) Signal modeling language (SML) A.1 Use of the SML A.2 Introduction
32	A.3 Physical types
35	A.4 Signal definitions
37	A.5 Pure signals
39	A.6 Pure signal-combining mechanisms
45	A.7 Pure function transformations A.8 Measure, limiting, and sampling signals
47	A.9 Digital signals
51	A.10 Basic component SML
77	A.11 Fast Fourier analysis support
79	Annex B (normative) Basic signal components (BSC) layer B.1 BSC layer base classes B.2 BSC subclasses
84	B.3 Description of a BSC
92	B.4 Physical class
104	B.5 PulseDefns class
105	B.6 SignalFunction class
164	Annex C (normative) Dynamic signal descriptions C.1 Introduction
165	C.2 Basic classes
173	C.3 Dynamic signal goals and use cases
175	Annex D (normative) Interface definition language (IDL) basic components D.1 Introduction D.2 IDL BSC library
176	Annex E (informative)Test signal framework (TSF) for C/ATLAS E.1 Introduction E.2 TSF library definition in extensible markup language (XML) E.3 Interface definition language (IDL) for the TSF for C/ATLAS
177	E.4 AC_SIGNAL
179	E.5 AM_SIGNAL
181	E.6 DC_SIGNAL
183	E.7 DIGITAL_PARALLEL
185	E.8 DIGITAL_SERIAL
187	E.9 DIGITAL_TEST
190	E.10 DME_INTERROGATION
193	E.11 DME_RESPONSE
196	E.12 FM_SIGNAL
199	E.13 ILS_GLIDE_SLOPE
202	E.14 ILS_LOCALIZER
205	E.15 ILS_MARKER
208	E.16 PM_SIGNAL
210	E.17 PULSED_AC_SIGNAL
212	E.18 PULSED_AC_TRAIN
214	E.19 PULSED_DC_SIGNAL
217	E.20 PULSED_DC_TRAIN
219	E.21 RADAR_RX_SIGNAL
221	E.22 RADAR_TX_SIGNAL
223	E.23 RAMP_SIGNAL
225	E.24 RANDOM_NOISE
227	E.25 RESOLVER
230	E.26 RS_232
231	E.27 SQUARE_WAVE
233	E.28 SSR_INTERROGATION
236	E.29 SSR_RESPONSE
240	E.30 STEP_SIGNAL
242	E.31 SUP_CAR_SIGNAL
244	E.32 SYNCHRO
248	E.33 TACAN
252	E.34 TRIANGULAR_WAVE_SIGNAL
254	E.35 VOR
258	Annex F (informative) Test signal framework (TSF) library for digital pulse classes F.1 Introduction F.2 TSF library definition in extensible markup language (XML) F.3 Graphical models of TSFs F.4 Pulse class family of TSFs
275	F.5 DTIF
277	Annex G (normative) Carrier language requirements G.1 Carrier language requirements G.2 Interface definition language (IDL) G.3 Datatypes
283	Annex H (normative) Test procedure language (TPL) H.1 TPL layer H.2 Elements of the TPL H.3 Structure of test requirements H.4 Carrier language H.5 Signal statements
285	H.6 Mapping of test statements to carrier language
286	H.7 Test statement definitions
304	H.8 Elements used in test statement definitions
307	H.9 Attributes with multiple properties
311	H.10 Transferring data in digital signals
315	H.11 Creating test requirements
317	H.12 Delimiting TPL statements
319	Annex I (normative) Extensible markup language (XML) signal descriptions I.1 Introduction
320	I.2 XSD for BSCs
326	I.3 XSD for TSFs
334	Annex J (informative) Support for ATLAS nouns and modifiers J.1 Signal and test definition (STD) support for ATLAS signals J.2 STD support for ATLAS nouns
337	J.3 STD support for C/ATLAS noun modifiers
345	J.4 Support for C/ATLAS extensions
346	Annex K (informative) Guide for maximizing test platform independence K.1 Introduction K.2 Guiding principles K.3 Best practice rules
350	Annex L (informative) IEEE download web-site material associated with this document
351	Annex M (informative) Bibliography
353	Back Cover