IEEE 1671.1-2009
$112.67
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions
| Published By | Publication Date | Number of Pages |
| IEEE | 2009 | 195 |
New IEEE Standard – Superseded. This document specifies an exchange format, using the extensible Markup Language (XML), for exchanging the test description information defining test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a Unit Under Test (UUT). This is in support of the development of Test Program Sets (TPSs) that will be used in an automatic test environment.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | IEEE Std 1671.1-2009 Front Cover |
| 2 | Blank Page |
| 3 | Title Page |
| 6 | Introduction Notice to users Laws and regulations |
| 7 | Copyrights Updating of IEEE documents Errata Patents |
| 8 | Participants |
| 10 | Contents |
| 11 | IMPORTANT NOTICE 1. Overview 1.1 General 1.2 Scope |
| 12 | 1.3 Purpose 1.4 Application 1.5 Conventions used within this document |
| 14 | 2. Normative references 3. Definitions, acronyms, and abbreviations 3.1 Definitions |
| 15 | 3.2 Acronyms and abbreviations 4. Schema—TestDescription.xsd 4.1 General |
| 16 | 4.2 Elements |
| 22 | 4.3 Simple types |
| 24 | 4.4 Complex types |
| 157 | 5. Conformance |
| 158 | 6. Extensibility |
| 159 | Annex A (informative)TestDescription instance documents (.XML files) A.1 TestDescription |
| 161 | Annex B (informative)Users information and examples B.1 Example UUT |
| 163 | B.2 Example 1 |
| 180 | B.3 Example 2 |
| 187 | B.4 Example 3 |
| 190 | B.5 Example 4 |
| 191 | B.6 Other examples |
| 193 | Annex C (informative)Referenced IEEE standards |
| 194 | Annex D (informative)Glossary |
| 195 | Annex E (informative)Bibliography |
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