IEEE 1671.2-2008
$73.13
IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions
| Published By | Publication Date | Number of Pages |
| IEEE | 2008 | 228 |
New IEEE Standard – Superseded. This trial-use standard specifies an exchange format, using eXtensible Markup Language (XML), for identifying instrumentation that may be integrated in an automatic test system (ATS) that is to be used to test and diagnose a unit under test (UUT).
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | IEEE Std 1671.2™-2008 |
| 3 | Title page |
| 6 | Introduction |
| 7 | Notice to users Laws and regulations Copyrights Updating of IEEE documents Errata Interpretations |
| 8 | Patents Participants |
| 10 | Contents |
| 13 | Important notice 1. Overview |
| 14 | 1.1 Scope 1.2 Purpose 1.3 Application |
| 15 | 1.4 Conventions used within this document |
| 17 | 2. Normative references |
| 18 | 3. Definitions, acronyms, and abbreviations 3.1 Definitions |
| 19 | 3.2 Acronyms and abbreviations |
| 23 | 4. Schema—InstrumentDescription.xsd 4.1 General 4.2 Elements |
| 25 | 4.3 Child elements |
| 28 | 4.4 Complex types |
| 43 | 4.5 Simple types 4.6 Inherited complex types |
| 44 | 4.7 Inherited attribute groups |
| 45 | 5. Schema—InstrumentInstance.xsd 5.1 General 5.2 Elements |
| 46 | 5.3 Child elements 5.4 Complex types 5.5 Inherited simple types |
| 47 | 5.6 Inherited complex types 5.7 Inherited attribute groups |
| 48 | 6. Conformance |
| 49 | 7. Extensibility |
| 50 | Annex A (informative) InstrumentDescription and InstrumentInstance instance documents (.XML files) A.1 InstrumentDescription |
| 51 | A.2 InstrumentInstance |
| 53 | Annex B (informative) Users information and examples B.1 Usage within an automatic test station |
| 54 | B.2 Instruments with calibration, capabilities, or triggering B.3 Instrument options B.4 Capabilities |
| 55 | B.5 Pins, ports, and connectors B.6 Specifications represented by graphs B.7 Parallel measurements (traces) |
| 56 | Annex C (normative) Synthetic instrumentation |
| 57 | C.1 Digital-to-analog conversion C.2 Analog-to-digital conversion |
| 58 | C.3 RF Downconversion C.4 RF Upconversion |
| 59 | C.5 CPU, DSP, FPGA, Memory C.6 Signal conditioning and switching |
| 60 | Annex D (normative) Synthetic instrument waveform generator requirements and XML template instance D.1 Synthetic instrument waveform generator requirements |
| 121 | D.2 Waveform generator XML template instance |
| 122 | Annex E (normative) Synthetic instrument digitizer requirements and XML template instance E.1 Synthetic instrument digitizer requirements |
| 167 | E.2 Digitizer XML template instance |
| 168 | Annex F (normative) Synthetic instrument down-converter requirements and XML template instance F.1 Synthetic instrument down-converter requirements |
| 187 | F.2 Down-converter XML template instance |
| 188 | Annex G (normative) Synthetic instrument external local oscillator specifications G.1 External LO requirements |
| 190 | G.2 Validation requirements |
| 191 | Annex H (normative) Synthetic instrument up-converter/synthesizer requirements and XML template instance H.1 Synthetic instrument up-converter/synthesizer requirements |
| 225 | H.2 Up-converter/synthesizer XML template instance |
| 226 | Annex I (informative) Glossary |
| 227 | Annex J (informative) Bibliography |
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