IEEE 1671 2006
$44.96
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
| Published By | Publication Date | Number of Pages |
| IEEE | 2006 | 99 |
New IEEE Standard – Inactive – Superseded. This document specifies the framework for the family of ATML standards. ATML defines a standard exchange medium for sharing information between components of an Automatic Test System (ATS), utilizing the eXtensible Markup Language (XML).
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | IEEE Std 1671-2006 Front Cover |
| 3 | Title Page |
| 6 | Introduction Notice to users Laws and regulations Copyrights |
| 7 | Updating of IEEE documents Errata Interpretations Patents |
| 8 | Participants |
| 10 | Contents |
| 11 | Important Notice 1. Overview 1.1 Scope 1.2 Purpose |
| 12 | 1.3 Application 1.4 Conventions used within this document |
| 13 | 2. Normative references 3. Definitions, acronyms, and abbreviations 3.1 Definitions |
| 15 | 3.2 Acronyms and abbreviations |
| 16 | 4. Automatic Test Markup Language 4.1 Background 4.2 Purpose 4.3 ATML and the product life cycle |
| 19 | 4.4 ATML framework |
| 21 | 4.5 Specification techniques |
| 23 | 4.6 ATML component standards |
| 25 | 4.7 XML schema names and locations |
| 26 | 5. Conformance 6. Extensibility |
| 27 | Annex A (normative) XML schema style guidelines |
| 35 | Annex B (normative) ATML common element schemas |
| 88 | Annex C (informative) Architecture examples |
| 94 | Annex D (informative) Glossary |
| 97 | Annex E (informative) Bibliography |
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