IEEE 1696 2014

$47.67

IEEE Standard for Terminology and Test Methods for Circuit Probes

Published By	Publication Date	Number of Pages
IEEE	2014	65

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Category: IEEE

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Description

New IEEE Standard – Active. Currently, no defined, industry-accepted method exists for characterizing the performance of electrical circuit probes. Each vendor has its own proprietary methods for characterization, leaving probe customers and users without a valid means of comparing probe performance and/or of understanding the circuit-loading effect of the probe. Methods for measuring parameters indicative of a probes or probe systems performance and guidance on the design and use of a test fixture for measuring probe performance are provided by this standard. An industry-accepted, unbiased means for characterizing probe performance is given by these methods. High-impedance voltage probes that are used to measure the performance of electrical circuits are considered by this standard. The probe systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe will include the mechanism by which the circuit is contacted. This method and standard will be applicable to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance at least five times greater than the impedance of the circuit under test.

PDF Catalog

PDF Pages	PDF Title
1	IEEE Std 1696-2013 Front Cover
3	Title Page
4	Abstract/Keywords
5	Important Notices and Disclaimers Concerning IEEE Standards Documents
8	Participants
9	Introduction
10	Contents
11	IMPORTANT NOTICE 1. Overview 1.1 Scope 1.2 Circuit probe background
12	1.3 Guidance to the user
13	1.4 Manufacturer-supplied information 2. Normative references
14	3. Definitions, abbreviations, and acronyms 3.1 Definitions 3.2 Abbreviations and acronyms
15	4. Special terms 5. Instrumentation
16	5.1 Digitizing oscilloscopes 5.2 Voltage sources 5.3 Vector network analyzers (VNAs) 5.4 Spectrum analyzers 5.5 Digital multimeters (DMMs) 5.6 Accessories
17	5.7 Signal conditioning 6. Test fixture 6.1 Design
25	6.2 Using the test fixture
29	6.3 Test fixture scattering parameter validation
30	7. Performance parameters 7.1 Input resistance (probe-only tests)
32	7.2 Output resistance (probe-only tests)
34	7.3 Gain (probe-only tests)
39	7.4 Linearity (probe-only test) 7.5 Output offset error (probe-only test)
41	7.6 Input offset error (probe-only test)
42	7.7 Equivalent input offset error (probe-only test) 7.8 Offset range (probe-only test)
45	7.9 Output return loss (probe only)
46	7.10 Equivalent input noise spectral density (probe only)
48	7.11 Equivalent integrated noise (probe only)
50	7.12 Large signal response (probe only)
53	7.13 Input impedance (probe only)
56	7.14 Input return loss with 50 Î© termination (probe only)
59	7.16 Transfer function (frequency response), source referred (probe only)
60	7.17 Common mode gain (probe only)
61	7.18 Common mode rejection ratio 7.19 Frequency magnitude response (probe-scope only)
63	7.20 Time (step) response (probe-scope only)