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IEEE 2000.2 1999

$58.50

IEEE Recommended Practice for Information Technology – Year 2000 Test Methods

Published By Publication Date Number of Pages
IEEE 1999 116
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New IEEE Standard – Inactive – Withdrawn. This document provides users of computer hardware, firmware, software, or data systems withrecommended practices for assessing and demonstrating the system elements within their organization thatmay be at risk of failure due to the Year 2000 problem and related date-specific issues. This recommendedpractice provides the framework for detailed planning and execution of all steps and tasks involved in testing for Year 2000 compliance. The resulting plan will outline the testing approach and identify system elementsthat are at risk of failure when crossing into the Year 2000 or using data that includes dates after 2000-01-01.

PDF Catalog

PDF Pages PDF Title
4 Introduction
5 Participants
7 CONTENTS
9 1. Overview
10 1.1 Scope
1.2 Purpose
1.3 Assumptions
2. References
11 3. Definitions
12 4. Editorial conventions and warnings
4.1 Editorial conventions
4.2 Warnings
14 5. Methodology
5.1 Year 2000 life cycle
5.2 Test process
18 5.3 Impact of external constraints on Year 2000 testing strategy
20 5.4 Test impact of remediation techniques
22 5.5 Special considerations involving embedded systems
26 5.6 Special-condition dates
30 5.7 Special date conditions
33 5.8 System components to be tested
34 6. System elements at risk
6.1 Interfaces: Shared control blocks/API/DDE/OLE
35 6.2 Archiving/restoring
41 6.3 Backup and restore
44 6.4 Calculations
48 6.5 Date determination
52 6.6 Hardware
54 6.7 Computer numerical controls
55 6.8 Communication protocols
56 6.9 Compilers
60 6.10 Event-triggers
64 6.11 Error handling
66 6.12 File access system
69 6.13 Globalization/internationalization
70 6.14 Synchronization of distributed networks
74 6.15 Import/export
78 6.16 Multisystem windowing
79 6.17 Licensing
81 6.18 Logs/date stamps
83 6.19 Merge
86 6.20 Parsing/validation
89 6.21 Performance
90 6.22 Operational time periods
92 6.23 Queries, filters, and data views
93 6.24 Data recovery
95 6.25 Bridge testing
98 6.26 Sorting
101 6.27 User interface (input and output)
102 6.28 Date format
104 Annex A—Search strings
105 Annex B—Dates
106 Annex C—Example archive documentation
109 Annex D—Alternative testing methodology
112 Annex E—Coverage overview
114 Annex F—Date systems
116 Annex G—Bibliography
IEEE 2000.2 1999
$58.50