IEEE 300 1988
$78.00
IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors
| Published By | Publication Date | Number of Pages |
| IEEE | 1988 | 35 |
Revision Standard – Active. This standard applies to semiconductor radiation detectors that are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described were selected to be readily available to all manufacturers and users of charged-particle detectors. Some superior techniques are not included because the methods are too complex or require equipment (such as particle accelerators)which may not be readily available. Test procedures for the associated ampli ers and preampli ers are described in ANSI/IEEE Std 301-1988 [2 ].1
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