Shopping Cart

No products in the cart.

IEEE 4-1995

$101.83

IEEE Standard Techniques for High-Voltage Testing

Published By Publication Date Number of Pages
IEEE 1995 137
Guaranteed Safe Checkout
Category:

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

Revision Standard – Superseded. This standard establishes standard methods to measure high-voltage and basic testing techniques, so far as they are generally applicable, to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltags, switching impulse voltages, and impulse currents. This revision implements many new procedures to improve accuracy, provide greater flexibility, and address practical problems associated with high-voltage measurements.

PDF Catalog

PDF Pages PDF Title
1 Title page
3 Foreword
4 Introduction
Participants
9 1. Overview
1.1 Scope
1.2 Purpose
1.3 Application
10 2. References
3. Definitions
13 4. General requirements
4.1 Arrangement of the test object
14 4.2 Interpretation of discharges in high-voltage tests
15 5. Tests with direct voltage
5.1 Test voltage
18 5.2 Test procedures
19 6. Tests with alternating voltage
6.1 Test voltage
22 6.2 Test procedures
27 7. Tests with lightning impulse voltage
7.1 Terms used to characterize full lightning impulses
29 7.2 Terms used to characterize chopped lightning impulses
32 7.3 Special lightning impulses
7.4 Voltage/time curves
7.5 Tolerances
33 7.6 Generation of the test voltage
7.7 Measurement of the test voltage and shape
34 7.8 Test procedures
36 8. Tests with switching impulse voltage
8.1 Terms used to characterize switching impulses
38 8.2 Tolerances
8.3 Generation of the test voltage
39 9. Tests with impulse current
8.4 Measurements of the test voltage and determination of the impulse shape
8.5 Test procedures
9.1 Terms used to characterize impulse currents
41 9.2 Tolerances
9.3 Measurement of the test current
42 10. Combined voltage tests
9.4 Measurement of voltage during tests with impulse currents
43 11. Composite tests
12. Measurement procedures
12.1 General
44 12.2 Principles
45 12.3 Terms related to measurement
46 12.4 General requirements on measuring systems
48 12.5 Measuring systems for direct voltage
12.6 Measuring systems for alternating voltages
12.7 Measuring systems for lightning and switching impulse voltages
50 13. Procedures to ensure accuracy in high-voltage measurements
13.1 General
12.8 Measuring systems for impulse currents
51 13.2 Measurement of direct voltages
53 13.3 Measurement of alternating voltages
56 13.4 Measurement of impulse voltages
69 13.5 Measurement of impulse currents
73 13.6 Evaluation of measurement accuracies
80 14. Tests in different ambient conditions
14.1 Dry tests
14.2 Wet tests
81 15. Artificial contamination tests
82 15.1 Preparation of test object
83 15.2 General test procedures
84 15.3 Power supply requirements for alternating voltage artificial contamination tests
86 15.4 Power supply requirements for direct-voltage artificial contamination tests
15.5 The clean fog test
93 15.6 The salt fog test
100 16. Atmospheric correction
16.1 Atmospheric conditions
101 16.2 Atmospheric correction factors
102 16.3 Measurement of humidity
103 16.4 Conflicting requirements for testing internal and external insulation
104 17. Voltage measurement by means of sphere gaps and rod gaps
17.1 Overview
106 17.2 Standard sphere gap
110 17.3 Connections of the sphere gap
111 17.4 The use of the sphere gap
112 17.5 Sphere-gap disruptive-discharge voltages
119 17.6 Use of a rod-rod gap for measuring direct voltage
121 17.7 Rod-rod gap sparkover data for impulse voltages
122 18. Reference voltage divider
18.1 Introduction
123 18.2 Overall design
18.3 Assembly
124 19. Statistical treatment of test results
18.4 Measuring cable
18.5 High-voltage lead
18.6 Response parameters
19.1 Classification of tests
126 19.2 Statistical behavior of disruptive discharge
127 19.3 Analysis of test results
129 19.4 Application of likelihood methods
130 20. Bibliography
IEEE 4-1995
$101.83