IEEE 404-2006
$62.83
IEEE Standard for Extruded and Laminated Dielectric Shielded Cable Joints Rated 2 500v to 500 000v
| Published By | Publication Date | Number of Pages |
| IEEE | 2006 | 37 |
Revision Standard – Superseded. This standard establishes electrical ratings and test requirements of cable joints used with extruded and laminated dielectric shielded cable rated in preferred voltage steps from 2500 to 500 000V. In addition, it defines test requirements for cable jacket and cable shield restoration devices. It also defines a variety of common joint constructions. This standard is designed to provide uniform testing procedures that can be used by manufacturers and users to evaluate the ability of underground power cable joints, and associated cable shield and cable jacket restoration components, to perform reliably in service.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | IEEE Std 404ā¢-2006 Front cover |
| 3 | Title page |
| 6 | Introduction Notice to users Errata Interpretations Patents |
| 7 | Participants |
| 9 | Contents |
| 11 | IEEE Standard for Extruded and Laminated Dielectric Shielded Cable Joints Rated 2 500 V to 500 000 V 1. Scope 2. Normative references |
| 13 | 3. Definitions 3.1 Cable joint categories 3.2 Joint constructions |
| 14 | 3.3 Other terms 4. Service conditions 5. Ratings 5.1 Voltage 5.2 Current and temperature |
| 17 | 6. Construction 6.1 Identification |
| 18 | 6.2 Shielding 6.3 Sheath/shield sectionalizers 7. Testing 7.1 Production tests for premolded and single-component cold-shrink joints |
| 19 | 7.2 Fingerprint tests for heat-shrink and multi-component cold-shrink joint components |
| 20 | 7.3 Fingerprint tests for elastomeric taped joint components |
| 21 | 7.4 Design tests and testing sequence for all joint types |
| 22 | 7.5 Design test conditions 7.6 Dielectric integrity tests |
| 25 | 7.7 Voltage withstand tests |
| 27 | 7.8 Short-time current test 7.9 Cyclic aging test for extruded dielectric and transition joints |
| 30 | 7.10 High-voltage time test 7.11 Sectionalizer tests |
| 31 | 7.12 Semiconducting shielding test 7.13 Cable metallic-shield restoration and cable jacket restoration components |
| 34 | 7.14 Connector thermal and mechanical tests |
| 35 | Annex A (informative) Typical values of heat-shrinkable and multi-component cold-shrink joint component tests and sampling rates |
| 36 | Annex B (informative) Typical values of elastomeric taped joint component tests and sampling rates |
| 37 | Annex C (informative) Bibliography |
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