IEEE 641 1988
$44.96
IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays
| Published By | Publication Date | Number of Pages |
| IEEE | 1988 | 34 |
New IEEE Standard – Inactive – Withdrawn. This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional operations; MNOS array retention; MNOS array endurance property; reliability considerations for MNOS arrays; the testing methodology necessary to establish the unique properties of the MNOS array for both the consumer and the producer; radiation effects on MNOS arrays; and nonvolatile memory technology, called floating-gate.
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