IEEE 759 1984
$58.50
IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
| Published By | Publication Date | Number of Pages |
| IEEE | 1984 | 52 |
New IEEE Standard – Inactive – Withdrawn. Administratively Withdrawn January 2007 Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented. Energy resolution, spectral distortion, pulse-height linearity, counting rate effects, overload effects, pulse-height stability, and efficiency are covered. Test procedures for pulse-height analyzers and computers are not covered.
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