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IEEE C37.083 1999

$51.46

IEEE Guide for Synthetic Capacitive Current Switching Tests of AC High-Voltage Circuit Breakers

Published By Publication Date Number of Pages
IEEE 1999 25
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New IEEE Standard – Active. This IEEE Standards product is part of the C37 family on Switchgear, Substations and Protective Relays. As an aid in testing circuit breakers under conditions of switching capacitive currents syn-thetic test circuits may be used. The design of the circuit should simulate the stress of actual service conditions as closely as possible. A number of circuits are given as examples. The limitation of the use of synthetic test methods is that the breaker under test must not display evidence of reignition or restriking. The known circuits do not properly represent the interaction between the source and the capacitive load under this condition. Such breakers must be tested using direct circuits.

PDF Catalog

PDF Pages PDF Title
1 Title page
3 Introduction
Participants
5 CONTENTS
7 1. Overview
1.1 Scope
8 1.2 Purpose
2. References
3. Definitions
9 4. Capacitive current switching process
4.1 Closing phenomena
10 4.2 Opening phenomena
5. Basic principles of synthetic capacitive current switching testing
11 6. Requirements for synthetic capacitive current switching
12 6.1 General conditions
6.2 Test circuit requirements
13 6.3 Test voltage
7. Examples of synthetic capacitance current switching test circuits
7.1 Test circuit with ac sources and capacitive branches
14 7.2 Test circuit with ac sources and an inductive branch
15 7.3 Test circuit with one ac source and a tuned circuit current branch
16 7.4 Test circuit with tuned circuit voltage branch
17 7.5 Test circuit not utilizing ac sources
18 8. Parameters, test procedures, and tolerances
19 8.1 High-current interval
8.2 Recovery voltage interval
9. Voltage regulation and transients
9.1 High-impedance source
20 9.2 Forced current zero
21 10. Closing (making) tests
10.1 Making without current interruption
10.2 Making with current interruption
22 11. Circuit breakers equipped with opening resistors
11.1 Direct test circuit
11.2 Two-part synthetic test circuits
23 12. Test duties
12.1 Test duties 1A and 1B
24 12.2 Other test duties
13. Test records
13.1 General
13.2 Recording of test results
25 13.3 Data reporting modifications
IEEE C37.083 1999
$51.46