IEEE C37.100.2 2018
$33.58
IEEE Standard for Common Requirements for Testing of AC Capacitive Current Switching Devices over 1000 V
| Published By | Publication Date | Number of Pages |
| IEEE | 2018 | 35 |
New IEEE Standard – Active. Common requirements for testing of AC capacitive current switching devices with nominal system voltage above 1000 V are provided in this standard
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | IEEE Std C37.100.2-2018 Front Cover |
| 2 | Title page |
| 4 | Important Notices and Disclaimers Concerning IEEE Standards Documents |
| 7 | Participants |
| 9 | Introduction |
| 10 | Contents |
| 11 | 1. Overview 1.1 Scope 1.2 Usage of terms 2. Normative references |
| 12 | 3. Definitions, acronyms, and abbreviations 3.1 Definitions 3.2 Acronyms and abbreviations |
| 13 | 4. Design tests 4.1 General 4.2 Ratings and applicability 4.2.1 Rated capacitive switching current 4.2.2 Rated maximum voltage (V) or (Ur) 4.2.3 Rated power frequency (fr) 4.2.4 Rated application grounding condition 4.2.5 Simultaneous or non-simultaneous operation |
| 14 | 4.2.6 Rated restrike performance 4.2.6.1 Applicability of rated restrike performance 4.3 Switching rating information |
| 15 | 4.4 Characteristics of the capacitive circuit to be switched 4.4.1 General |
| 16 | 4.4.2 Recovery voltage after breaking 4.4.3 Recovery voltage after restrike clearing 4.4.3.1 For Class C2 4.4.3.2 For all Class C1 and C0 4.4.4 Line-charging current and cable-charging current circuit |
| 17 | 4.4.5 Capacitor bank grounding for current switching tests 4.4.6 Back-to-back capacitive current in switching tests 4.5 Characteristics of supply circuits 4.5.1 General |
| 18 | 4.5.2 Test voltage and grounding, three-phase test 4.5.3 Test voltage, direct single-phase test, and synthetic testing |
| 19 | 4.5.4 Tests with specified capacitive recovery voltage |
| 22 | 4.6 Test current 4.6.1 General 4.6.2 Test current for three-phase testing 4.6.3 Waveform of the current 4.6.4 Test current when breaking in the presence of ground faults |
| 23 | 4.6.5 Damping factor for inrush currents 4.6.6 Back-to-back testing 4.7 Preconditioning for devices rated for fault current interrupting—Class C2 4.7.1 General 4.7.2 Preconditioning procedure |
| 24 | 4.8 Test programs for time-controllable devices 4.8.1 Test conditions |
| 25 | 4.8.2 Alternative of separate making tests 4.8.3 Capacitive current switching device operating characteristics before test initiation 4.8.4 Determination of minimum arcing time |
| 26 | 4.8.5 Test duties |
| 27 | 4.8.6 Combination of capacitive current switching tests for Class C2 and Class C1 testing 4.8.7 Criteria to pass Class C2 testing (for time-controllable devices) 4.8.8 Criteria to pass Class C1 testing (for time-controllable devices) |
| 28 | 4.8.9 Criteria to pass Class C0 testing (for time-controllable devices) 4.9 Test procedures for random switching 4.9.1 General 4.9.2 Test-duty |
| 29 | 4.9.3 Probability of restrike test classification 4.9.3.1 General 4.9.3.2 Criteria to achieve Class C2 (for random switching tests) 4.9.3.3 Criteria to achieve Class C1 (for random switching tests) 4.9.3.4 Criteria to achieve Class C0 (for random switching tests) |
| 30 | 4.10 Common criteria to pass capacitive switching tests 4.10.1 General 4.10.2 Voltage withstand tests |
| 31 | 4.10.3 Visual inspection 4.10.4 Behavior of capacitive current switching device during tests 4.10.5 Non-sustained disruptive discharges 4.11 Frequency considerations 4.12 Harmonization with IEC |
| 32 | Annex A (informative) Bibliography |
| 33 | Annex B (informative) Recommendations for application of this standard to relevant standards B.1 Introduction B.2 Normative references B.3 Default requirements |
| 35 | Back Cover |
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IEEE C37.100.2-2018
IEEE Standard for Common Requirements for Testing of AC Capacitive Current Switching Devices over 1000…
