IEEE C37.301-2009
$96.96
IEEE Standard for High-Voltage Switchgear (Above 1000 V) Test Techniques–Partial Discharge Measurements
Published By | Publication Date | Number of Pages |
IEEE | 2009 | 74 |
New IEEE Standard – Active. This standard adopts IEC 60270:2000 and defines methods of measuring partial discharges that may occur in energized power switchgear apparatus, in flaws, voids, and interfaces of non-self restoring insulation that may lead to dielectric failure of the switchgear.
PDF Catalog
PDF Pages | PDF Title |
---|---|
3 | Title page |
6 | Introduction |
7 | Notice to users Laws and regulations Copyrights Updating of IEEE documents Errata Interpretations |
8 | Patents Participants |
10 | Contents of IEEE Adoption of IEC 60270:2000 |
11 | Important notice |
12 | IEC 60270:2000 |
19 | 1 Scope |
20 | 2 Normative references 3 Definitions |
25 | 4 Test circuits and measuring systems |
31 | 5 Calibration of a measuring system in the complete test circuit |
32 | 6 Calibrators |
33 | 7 Maintaining the characteristics of calibrators and measuring systems |
38 | 8 Tests |
40 | 9 Measuring uncertainty and sensitivity 10 Disturbances |
41 | 11 Partial discharge measurements during tests with direct voltage |
48 | Annex A (normative) Performance test on a calibrator |
51 | Annex B (informative) Test circuits |
53 | Annex C (informative) Measurements on cables, gas insulated switchgear, power capacitors and on test objects with windings |
54 | Annex D (informative) The use of radio disturbance (interference) meters for the detection of partial discharges |
56 | Annex E (informative) Guidelines to digital acquisition of partial discharge quantities |
59 | Annex F (informative) Non-electrical methods of PD detection |
60 | Annex G (informative) Disturbances |
63 | Annex H (informative) Other reference standard and symbols |
64 | Annex I (normative) Testing procedures I.1 Introduction I.2 Conditioning of the test object I.3 Test procedure |
66 | Annex J (informative) PD pattern recognition J.1 Introduction J.2 Noises |
70 | J.3 Pattern recognition |
73 | Annex K (informative) IEEE bibliography |