IEEE C62.35-2010:2018 Edition
$74.21
IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components
| Published By | Publication Date | Number of Pages |
| IEEE | 2018 | 11 |
Revision Standard – Superseded. Superseded by C62.59-2019. Avalanche breakdown diodes used for surge protection in systems with voltages equal to or less than 1000 V rms or 1200 V dc are discussed in this standard. The avalanche breakdown diode surge suppressor is a semiconductor diode which can operate in either the forward or reverse direction of its V-I characteristic. This component is a single package, which may be assembled from any combination of series and/or parallel diode chips.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | IEEE Std C62.35-2010/Cor 1-2018 Front Cover |
| 2 | Title page |
| 4 | Important Notices and Disclaimers Concerning IEEE Standards Documents |
| 7 | Participants |
| 8 | Introduction |
| 9 | Contents |
| 10 | 8.8.1 Rated forward surge current test method (See Figure 8) |
| 11 | Back Cover |
Related products
-
IEEE C62.36-2014
IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits…
-
IEEE C62.62-2000
IEEE Standard Test Specifications for Surge Protective Devices for Low Voltage AC Power Circuits Published…
-
IEEE C62.36 2016
IEEE Standard Test Methods for Surge Protectors and Protective Circuits Used in Information and Communications…
-
IEEE C62.33-2016
IEEE Standard for Test Methods and Performance Values for Metal-Oxide Varistor Surge Protective Components Published…
-
IEEE C62.44 2016:2017 Edition
IEEE Guide for the Application of Low-Voltage (1000 V rms or Less) Surge Protective Devices…
-
IEEE C62.62 2011
IEEE Standard Test Specifications for Surge-Protective Devices (SPDs) for Use on the Load Side of…
-
IEEE C62.69 2016
IEEE Approved Draft Standard for the Surge Parameters of Isolating Transformers Used in Networking Devices…
-
IEEE C62.11-2020(Redline)
IEEE Standard for Metal-Oxide Surge Arresters for AC Power Circuits (>1 kV) (Redline) Published By…
-
IEEE C62.55 2017 Cor1 2018:2019 Edition
IEEE Trial-Use Guide for Surge Protection of DC Power Feeds to Remote Radio Heads –…
-
IEEE C62.36-2000
IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits…
-
IEEE C62.31-2020
IEEE Standard for Test Methods and Preferred Values for Low-Voltage Gas Discharge Tube Surge-Protective Components…
-
IEEE C62.62-2018
IEEE Standard Test Specifications for Surge-Protective Devices (SPDs) for Use on the Load Side of…
-
IEEE C63.15-2010
American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment Published…
-
IEEE C62.55 2017/Cor1 2018:2019 Edition
IEEE Trial-Use Guide for Surge Protection of DC Power Feeds to Remote Radio Heads –…
-
IEEE C62.39-2012
IEEE Standard for Test Methods and Preferred Values for Self-Restoring Current-Limiter Components Used in Telecommunication…
-
IEEE C62.34-2017
IEEE Standard for Test Methods and Performance of Low-Voltage (1000 V rms or Less) Surge…
-
IEEE C62.59-2019
IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes Published By…
-
IEEE C62.36-2016
IEEE Standard Test Methods for Surge Protectors and Protective Circuits Used in Information and Communications…
-
IEEE C62.11-2012
IEEE Standard for Metal-Oxide Surge Arresters for AC Power Circuits (>1 kV) Published By Publication…
-
IEEE C62.62-2010
IEEE Standard Test Specifications for Surge-Protective Devices (SPDs) for Use on the Load Side of…
-
IEEE C62.35 2010/Cor1 2018
IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components–Corrigendum 1 Published By Publication…
-
IEEE C62.35-2010
IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components Published By Publication Date…
-
IEEE C62.31-2020(Redline)
IEEE Standard for Test Methods and Preferred Values for Low-Voltage Gas Discharge Tube Surge-Protective Components…
-
IEEE C62.55 2020
IEEE Guide for Surge Protection of DC Power Feeds to Remote Radio Heads Published By…
-
IEEE C62.35 2010
IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components Published By Publication Date…
-
IEEE C63.15 2010
American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment Published…
-
IEEE C62.55-2017:2018 Edition
IEEE Guide for Surge Protection of DC Power Feeds to Remote Radio Heads Published By…
-
IEEE C62.36 2000
IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits…
-
IEEE C62.34 2017
IEEE Standard for Test Methods and Performance of Low-Voltage (1000 V rms or Less) Surge…
-
IEEE C62.36 2014
IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits…
-
IEEE C62.39-2012
IEEE Standard for Test Methods and Preferred Values for Self-Restoring Current-Limiter Components Used in Telecommunication…
-
IEEE C62.31-2020(Redline)
IEEE Standard for Test Methods and Preferred Values for Low-Voltage Gas Discharge Tube Surge-Protective Components…
-
IEEE C62.11 2012
IEEE Standard for Metal-Oxide Surge Arresters for AC Power Circuits (>1 kV) Published By Publication…
-
IEEE C62.33 2016:2018 Edition
IEEE Standard for Test Methods and Performance Values for Metal-Oxide Varistor Surge Protective Components Published…
-
IEEE C62.11-2012
IEEE Standard for Metal-Oxide Surge Arresters for AC Power Circuits (>1 kV) Published By Publication…
-
IEEE C62.55 2017
IEEE Guide for Surge Protection of DC Power Feeds to Remote Radio Heads Published By…
-
IEEE C62.35 2010 Cor1 2018
IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components–Corrigendum 1 Published By Publication…
-
IEEE C62.11 2020
IEEE Standard for Metal-Oxide Surge Arresters for AC Power Circuits (>1 kV) Published By Publication…
-
IEEE C62.11-2012(Redline)
IEEE Standard for Metal-Oxide Surge Arresters for AC Power Circuits (>1 kV) (Redline) Published By…
-
IEEE C62.39 2013
IEEE Standard for Test Methods and Preferred Values for Self-Restoring Current-Limiter Components Used in Telecommunication…
