IEEE C62.36 2014
$89.38
IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits
| Published By | Publication Date | Number of Pages |
| IEEE | 2014 | 142 |
Revision Standard – Active. Surge protectors for application on multiconductor balanced or unbalanced data, communications, and signaling circuits with voltages equal to or less than 1000 Vrms, or 1200 V dc are covered by this standard. These surge protectors are designed to limit voltage surges, current surges, or both. The methods of testing and criteria for determining the end of life of electrical surge protectors used in low-voltage data, communications, and signaling circuits are described. The surge protectors covered are multiple-component series or parallel combinations of linear or nonlinear elements, packaged for the purpose of limiting voltage, current, or both. This standard is not intended to cover packaged single gas tube, air gap, varistor, or avalanche junction surge-protective devices, which are covered by IEEE Std C62.31(TM), IEEE Std C62.32(TM), IEEE Std C62.33(TM), and IEEE Std C62.35(TM), respectively.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | IEEE Std C62.36™-2014 |
| 3 | Title page |
| 5 | Important Notices and Disclaimers Concerning IEEE Standards Documents |
| 8 | Participants |
| 10 | Introduction |
| 11 | Contents |
| 13 | IMPORTANT NOTICE 1. Overview 1.1 Scope |
| 14 | 1.2 Purpose 2. Normative references 3. Definitions, acronyms, and abbreviations 3.1 Definitions |
| 15 | 3.2 Acronyms and abbreviations |
| 16 | 4. Service conditions 4.1 Normal service conditions 4.1.1 Environmental conditions |
| 17 | 4.1.2 Physical properties 4.1.3 System conditions 4.1.4 Surge ratings of the surge protector under system conditions 4.2 Unusual service conditions 4.2.1 Environmental conditions |
| 18 | 4.2.2 Physical conditions 4.2.3 System conditions 4.3 Radiation 5. Basic configurations |
| 20 | 6. Standard design test procedure 6.1 Standard design test criteria 6.2 Statistical procedures 6.3 Test conditions 6.4 Test measurements 7. Surge protector characteristics 7.1 General |
| 21 | 7.2 DC series resistance 7.2.1 Background 7.2.2 Purpose 7.2.3 Equipment 7.2.4 Protector states subject to test 7.2.5 Procedure 7.2.6 Alternative methods 7.2.7 Suggested test data |
| 22 | 7.2.8 Requirements 7.2.9 Comments 7.3 Standby current and insulation resistance 7.3.1 Background 7.3.2 Purpose 7.3.3 Equipment 7.3.4 Protector states subject to test |
| 23 | 7.3.5 Procedure 7.3.6 Alternative method |
| 24 | 7.3.7 Suggested test data 7.3.8 Requirements 7.3.9 Comments 7.4 DC ringing current 7.4.1 Background |
| 25 | 7.4.2 Purpose 7.4.3 Equipment 7.4.4 Protector states subject to test |
| 26 | 7.4.5 Procedure 7.4.6 Alternative methods |
| 27 | 7.4.7 Suggested test data 7.4.8 Requirements 7.4.9 Comments |
| 28 | 7.5 Distortion 7.5.1 Background 7.5.2 Purpose 7.5.3 Equipment |
| 29 | 7.5.4 Equipment states subject to test |
| 30 | 7.5.5 Procedure |
| 33 | 7.5.6 Alternative methods 7.5.7 Suggested test data 7.5.8 Requirements |
| 34 | 7.5.9 Comments 7.6 Capacitance 7.6.1 General capacitance 7.6.2 Background |
| 35 | 7.6.2.1 Voltage-dependent capacitance |
| 36 | 7.6.2.2 Separating out the individual capacitive components |
| 37 | 7.6.3 Equipment 7.6.4 Equipment states subject to test |
| 38 | 7.6.5 Procedure 7.6.6 Alternative methods 7.6.7 Suggested test data 7.6.8 Requirements 7.6.9 Comments |
| 39 | 7.7 Inductance 7.7.1 Background 7.7.1.1 Purpose 7.7.1.2 Equipment 7.7.2 Protector states subject to test 7.7.3 Procedure |
| 40 | 7.7.4 Alternative methods 7.7.5 Suggested test data 7.7.6 Requirements 7.7.7 Comments |
| 41 | 7.8 Transmission properties: insertion loss, return loss, and phase shift 7.8.1 Background 7.8.2 Purpose 7.8.3 Equipment 7.8.4 Equipment states subject to test |
| 42 | 7.8.5 Procedures 7.8.5.1 Twisted-pair cable surge protector, no bias |
| 43 | 7.8.5.2 Twisted-pair cable surge protector, biased |
| 44 | 7.8.5.3 Coaxial or unbalanced protectors, no bias |
| 45 | 7.8.5.4 Coaxial or unbalanced protectors, biased |
| 46 | 7.8.6 Alternative methods 7.8.7 Suggested test data |
| 47 | 7.8.8 Requirements 7.8.9 Comments 7.9 Longitudinal conversion transfer loss 7.9.1 Background |
| 48 | 7.9.2 Purpose 7.9.3 Equipment |
| 49 | 7.9.4 Protector states subject to test 7.9.5 Procedure |
| 50 | 7.9.6 Alternative methods 7.9.7 Suggested test data 7.9.8 Requirements 7.9.9 Comments |
| 51 | 8. Surge protector ratings 8.1 General 8.2 DC-limiting voltage 8.2.1 Background 8.2.2 Purpose 8.2.3 Equipment |
| 52 | 8.2.4 Protector states subject to test 8.2.5 Procedure 8.2.5.1 Test circuits |
| 54 | 8.2.5.2 Test procedure |
| 55 | 8.2.6 Alternative method 8.2.6.1 Equipment: |
| 56 | 8.2.6.2 Procedure 8.2.7 Suggested test data 8.2.8 Requirement |
| 57 | 8.2.9 Comments 8.3 Impulse-limiting voltage 8.3.1 Background 8.3.2 Purpose 8.3.3 Equipment |
| 58 | 8.3.4 Protector states subject to test 8.3.5 Procedure |
| 60 | 8.3.6 Alternative methods 8.3.7 Suggested test data 8.3.8 Requirements 8.3.9 Comments |
| 61 | 8.4 Transition current for thermally activated devices 8.4.1 Background 8.4.2 Purpose 8.4.3 Equipment 8.4.4 Protector states subject to test 8.4.5 Procedure |
| 63 | 8.4.6 Alternative methods 8.4.7 Suggested test data 8.4.8 Requirement 8.4.9 Comments 8.5 Time to-trip for thermally activated devices 8.5.1 Background 8.5.2 Purpose 8.5.3 Equipment |
| 64 | 8.5.4 Protector states subject to test 8.5.5 Procedure |
| 65 | 8.5.6 Alternative methods 8.5.6.1 Equipment |
| 66 | 8.5.6.2 Procedure |
| 67 | 8.5.7 Suggested test data |
| 68 | 8.5.8 Requirements 8.5.9 Comments 8.6 Impulse reset 8.6.1 Background 8.6.2 Purpose 8.6.3 Equipment |
| 69 | 8.6.4 Protector states subject to test 8.6.5 Procedures |
| 71 | 8.6.6 Alternate methods 8.6.7 Suggested test data 8.6.8 Requirements |
| 72 | 8.6.9 Comments 8.7 AC life (durability) 8.7.1 Background 8.7.2 Purpose 8.7.3 Equipment 8.7.4 Protector states subject to test 8.7.5 Procedure |
| 75 | 8.7.6 Alternative methods 8.7.7 Suggested test data 8.7.8 Requirements 8.7.9 Comments 8.8 Impulse life (durability) 8.8.1 Background |
| 76 | 8.8.2 Purpose 8.8.3 Equipment 8.8.4 Protector states subject to test |
| 77 | 8.8.5 Procedure |
| 78 | 8.8.6 Alternative methods |
| 79 | 8.8.7 Suggested test data 8.8.8 Requirements 8.8.9 Comments 8.9 Maximum single-impulse discharge 8.9.1 Background 8.9.2 Purpose 8.9.3 Equipment |
| 80 | 8.9.4 Protector states subject to test 8.9.5 Procedure 8.9.6 Alternative methods |
| 81 | 8.9.7 Suggested test data 8.9.8 Requirements 8.9.9 Comments 8.10 Voltage reset (electronic current limiters) 8.10.1 Background 8.10.2 Purpose |
| 82 | 8.10.3 Equipment 8.10.4 Protector states subject to test 8.10.5 Procedure |
| 83 | 8.10.6 Alternative methods 8.10.7 Suggested test data 8.10.8 Requirements 8.10.9 Comments |
| 84 | 8.11 Multiport coupling 8.11.1 Background 8.11.2 Purpose 8.11.3 Standards that address multiport coupling 8.11.3.1 IEEE Std C62.50™ 8.11.3.2 ANSI/TIA-1194 8.11.3.3 ITU-T Recommendation K.44 |
| 85 | 8.12 Transverse surge generation 8.12.1 Background 8.12.2 Purpose 8.12.3 Equipment and test circuit (Figure 34) |
| 86 | 8.12.4 Protector states subject to test 8.12.5 Procedure 8.12.5.1 Impulse calibration 8.12.5.2 Voltage probe calibration |
| 87 | 8.12.5.3 Current probe calibration 8.12.5.4 Transverse voltage measurement 8.12.6 Alternative methods 8.12.7 Suggested test data |
| 88 | 8.12.8 Requirements 8.12.9 Comments 8.13 In-line surge protector: protected port surge current let-through 8.13.1 Background |
| 89 | 8.13.2 Purpose 8.13.3 Equipment and test circuits |
| 90 | 8.13.4 Protector states subject to test 8.13.5 Procedure 8.13.6 Suggested test data 8.13.7 Requirements 8.13.8 Comments |
| 91 | 8.14 In-line surge protector: surge series resistance 8.14.1 Background 8.14.2 Purpose 8.14.3 Equipment 8.14.4 Protector states subject to test 8.14.5 Procedure |
| 93 | 8.14.6 Alternative methods 8.14.7 Suggested test data 8.14.8 Requirements 8.14.9 Comments 8.15 In-line surge protector: protected-port ground potential rise 8.15.1 Background 8.15.1.1 Lightning ground potential rise |
| 94 | 8.15.1.2 In-line surge protector: differential ground potential rise surge |
| 95 | 8.15.2 Purpose 8.15.3 Equipment and test circuits 8.15.4 Protector states subject to test 8.15.5 Procedure 8.15.5.1 Differential ground potential rise test levels |
| 96 | 8.15.5.2 Procedure steps 8.15.6 Alternative methods 8.15.7 Suggested test data |
| 97 | 8.15.8 Requirements 8.15.9 Comments 8.16 In-line surge protector: protected-port ground lead inductive voltage spike 8.16.1 Background |
| 98 | 8.16.2 Purpose 8.16.3 Equipment and test circuits 8.16.4 Protector states subject to test 8.16.5 Procedure 8.16.5.1 Figure 42 circuit values |
| 99 | 8.16.5.2 Procedure steps 8.16.6 Alternative methods 8.16.7 Suggested test data |
| 100 | 8.16.8 Requirements 8.16.9 Comments 8.17 Environmental cycling with impulse surges 8.17.1 Background 8.17.2 Purpose 8.17.3 Equipment 8.17.4 Protector states subject to test |
| 101 | 8.17.5 Procedure |
| 102 | 8.17.6 Alternative methods 8.17.7 Suggested test data 8.17.8 Requirements |
| 103 | 8.17.9 Comments 8.18 Environmental cycling with ac exposure 8.18.1 Background 8.18.2 Purpose 8.18.3 Equipment 8.18.4 Protector states subject to test |
| 104 | 8.18.5 Procedures 8.18.6 Alternative methods 8.18.7 Suggested test data |
| 105 | 8.18.8 Requirements 8.18.9 Comments 9. Failure modes |
| 106 | Annex A (informative) Examples of internal arrangements of surge-limiting devices |
| 109 | Annex B (informative) Test measurement techniques B.1 General B.2 Safety B.3 Oscilloscopes B.4 Voltage measurements |
| 111 | B.5 Current measurements |
| 112 | Annex C (informative) Impulse generators C.1 Introduction C.2 Types of impulse generator C.3 Impulse generator parameters |
| 115 | C.4 Impulse generators typically used for surge protector testing |
| 118 | C.5 Impulse generator circuits |
| 122 | C.6 Combination-wave generators |
| 125 | C.7 Expanding single-output generators to multiple output |
| 128 | C.8 Generator variants |
| 132 | Annex D (informative) Cable discharge events D.1 Background D.2 Event characteristics |
| 133 | D.3 Test methods |
| 135 | Annex E (informative) Gas discharge tube oscillation E.1 Gas discharge tube-based surge protector oscillation test |
| 140 | Annex F (informative) Bibliography |
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IEEE C62.36-2014
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