IEEE IEC 61671 4 2016
$39.00
IEC/IEEE International Standard – Standard for Automatic Test Markup Language (ATML) Test Configuration
| Published By | Publication Date | Number of Pages |
| IEEE | 2016 | 60 |
– Active. An exchange format is specified in this standard, using extensible markup language (XML), for identifying the test configuration used to test for and diagnose faults of a unit under test (UUT) on an automatic test system (ATS).
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | IEC 61671-4-2016, Adoption of IEEE Std 1671.4-2014 Front Cover |
| 4 | CONTENTS |
| 5 | FOREWORD |
| 9 | INTRODUCTION |
| 13 | Important Notice 1. Overview 1.1 General |
| 14 | 1.2 Application of this document’s annexes 1.3 Scope 1.4 Application |
| 15 | 1.5 Conventions used within this document |
| 16 | 2. Normative references 3. Definitions, acronyms, and abbreviations 3.1 Definitions |
| 17 | 3.2 Acronyms and abbreviations |
| 19 | 4. TestConfiguration schema 4.1 Background 4.2 Test configuration.xsd |
| 44 | 5. TestConfiguration instance schema 6. ATML TestConfiguration XML schema names and locations |
| 46 | 7. ATML XML schema extensibility 8. Conformance |
| 47 | Annex A (informative) IEEE download web-site material associated with this document |
| 48 | Annex B (informative) Test Configuration XML element mappings to MTPSI card fields |
| 53 | Annex C (informative) Examples |
| 56 | Annex D (informative) Bibliography |
| 57 | Annex E (informative) IEEE List of Participants |
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